Thermo escalab 250xi spectrometer

¹H nuclear magnetic resonance (NMR) spectrum was recorded on a Bruker Advancell spectrometer with DMSO as the solvent. All samples were analyzed by FT-IR spectroscopy, which were measured by a Bruker VERTEX70 FT-IR spectrophotometer in the wave number range of 400–4000 cm⁻¹ using potassium bromide (KBr) pellets. The X-ray diffraction (XRD) analysis was recorded using a PANalytical Empyrean diffractometer, which equipped with Cu Kalpha1 radiation (1.5405 Å), the scanning rate was 15°/min in the 2θ range of 5–80° at room temperature. The morphology of the nanocomposites was characterized on Hitachi S-4800 scanning electron microscopy (SEM) at 20 kV and FEI Tecnai F20 transmission electron microscopy (TEM) at an acceleration voltage of 200 kV. Thermogravimetric analysis (TGA) was tested on a STA6000 thermogravimetric analyzer in air at a heating rate of 20 °C/min from room temperature to 950 °C. Luminescence spectra were tested at room temperature using a FLS-980 (Edinburgh Instruments, England) with a xenon lamp as the light source. Phosphorescence spectra were measured at 355 nm and 372 nm excitation on a FLS-980 spectrofluorometer at 77 K. X-ray photoelectron spectroscopy (XPS) spectra were recorded on Thermo ESCALAB 250Xi spectrometer (Thermo Fisher Scientific, Waltham, MA, USA).

The surface morphology of the four RPA samples was observed using a Scanning Electron Microscope (GeminiSEM 500, Germany), and the specific surface area and pore change were determined by a Tristar II 3020M analyzer (Micromeritics, USA). The FTIR spectra of the four RPA samples were recorded on a Fourier transform infrared spectrometer (Thermo Nicolet 8,700, USA). Each sample was blended with KBr at a 1:20 ratio and scanned from 4,000 to 400 cm⁻¹ wavenumbers. The XPS spectra were recorded on a Thermo ESCALAB250Xi spectrometer (Thermo Fisher Scientific Co. Ltd, UK) with an excitation source of monochromatized Al Kα (hv = 1486.6 eV) and a pass energy of 30 eV. The values of binding energies were calibrated with the C 1s peak of contaminant carbon at 284.80 eV. The thermostability of RPA was characterized using a thermal gravimetric analyzer (TGA Q5000iR, USA) at a heating procedure of 5°C/min from 25 to 600°C under a nitrogen atmosphere.

Scanning electron microscope (SEM) with an energy-dispersive X-ray spectroscopy detector (EDS) (Bruker AXE, Karlsruhe, Germany) was recorded on a VEGA 3SBU instrument (Tescan Co., Brno, Czech Republic). Low resolution transmission electron microscope (TEM) images were determined on a JEOL JEM 1200EX (Akishima-shi, Tokyo, Japan) working at 100 kV. High-resolution TEM images (HRTEM) and selected-area electronic diffraction (SAED) patterns were recorded with FEI Tecnai G2 F20 S-Twin (Hillsboro, OR, USA) working at 200 kV. The crystalline phases of the as-prepared Pd-based catalysts and the reused catalyst were recorded on a Bruker D2-PHASER X-ray diffractometer (XRD) (Bruker AXE, Karlsruhe, Germany) with nickel-filtered Cu Kα radiation (λ = 1.5417 Å, 40 kV, 25 mA) in the 2θ zone of 10°–90°. The Pd content of the Pd/NiO catalyst was collected on Spectro Arcos ICP-OES (Germany Spectro Analysis Co., Ltd., Kleve, North Rhine-Westphalia, Germany). X-ray photoelectron spectroscopy (XPS) was recorded on Thermo ESCALAB 250XI spectrometer (ThermoFisher Scientific Co., Ltd., Waltham, MA, USA). BET surface areas were determined on a SSA-4200 Specific Surface Area and Porosity Analyzer (Beijing Builder Electronic Technology Co., Ltd., Beijing, China) with 30% v/v N₂/H₂ flow using pure N₂ (99.99%) as an internal standard.

The microstructure and morphology of prepared samples were analyzed. X-ray diffraction (XRD) data were recorded on Bruker D8 Advance (Bruker, Karlsruhe, Germany) at 40 kV/30 mA with Cu $k_{\alpha }$ radiation ( $\mathsf{\lambda }$ = 0.15418 nm). Transmission electron microscopy (TEM) and high-resolution microscopy (HRTEM) were analyzed on JEOL JEM-2000EX (JEOL, Tokyo, Japan). Raman spectra was conducted on HORIBA Jobin Yvon LaRam (HORIBA Jobin Yvon, Paris, France), equipped with a 532 nm wavelength laser and full-range grating. X-ray photoelectron spectroscopy (XPS) was utilized to study surface chemical analysis by Thermo ESCALAB 250Xi spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) with an Al- $k_{\alpha }$ radiation source. TG-DSC-DTG analysis was operated on PerkinElmer TGA-8000 (PerkinElmer, Waltham, MA, USA) in nitrogen atmosphere at a heating rate of 10 °C min⁻¹ at the temperature ranging from room temperature to 800 °C. The specific surface area was measured on JWGB JW-BK 100 (JWGB, Beijing, China). Photoluminescence emission spectra (PL) were obtained using 280 nm as an excitation wavelength on PerkinElmer Lamba 45 (PerkinElmer, Waltham, MA, USA).