The EL spectra were obtained using a spectrometer (FLS980, Edinburgh Instruments). The density–voltage–luminance characteristics of the current were measured by a source meter (2400, Keithley instruments) and luminance meter (LS110, Konica Minolta). The device performance could be found in the Additional file 1 : Figs. S1 and S2.
Ls 110
Manufactured by Konica Minolta
Sourced in Japan
The LS-110 is a luminance and color meter that measures the brightness and chromaticity of light sources and displays. It is designed to provide accurate and reliable measurements for various applications.
Automatically generated - may contain errors
Lab products found in correlation
Uv 3600, by Shimadzu (2 mentions)
Fls980, by Edinburgh Instruments (1 mentions)
Dimension icon, by Bruker (1 mentions)
Dimension icon pt, by Bruker (1 mentions)
Trinitron multiscan g520, by Sony (1 mentions)
Hr2000 spectrometer, by OceanOptics (1 mentions)
Fluorolog 3, by Horiba (1 mentions)
F 4500 spectrophotometer, by Hitachi (1 mentions)
S 4800, by Hitachi (1 mentions)
Uv 1700, by Shimadzu (1 mentions)
Tecnai g2, by Philips (1 mentions)
Cary 50, by Agilent Technologies (1 mentions)
Fluoromax 3, by Horiba (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
16 protocols using ls 110
1
Characterization of Electroluminescent Devices
2
Characterization of Flexible OLED Devices
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The sheet resistance was measured with a four-probe ST-21 system. The transmittance spectra were obtained with a UV3600 (SHIMADZU). SEM was conducted on a JSM-7500F field-emission scanning electron microscope. The surface roughness was measured using an atomic force microscope (AFM) (Dimension Icon, Bruker Corporation) in tapping mode. An Agilent B2902A source meter and a Minolta luminance meter LS-110 were simultaneously used to measure the current density, voltage, luminance (J–V–L) characteristics of the flexible OLED. The electroluminescence (EL) spectra were recorded with a Spectroscan PR655 spectrometer.
3
Psychophysical Measurements of Contrast Sensitivity
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
CS functions were also measured psychophysically with the software PSYCHO for Windows v2.36 (Cambridge Research) using a Sony Trinitron 19 in. (GFD-420). The monitor was driven by a Cambridge Research VSG 2/4 graphics board with a refresh rate of 100 Hz non-interlaced and an 800 600 resolution.
The stimuli used were horizontal sinusoidal gratings with an average luminance of 10 fL, that is, 34.4 cd/m², measured using an Optical OP200-E photometer (Cambridge Research) and a visual angle of 4°. The luminance output of the screen was calibrated using a luminance meter (LS-110, Konica Minolta Sensing, Inc., Osaka, Japan). Screen uniformity was checked at maximum output. The contrast of the sinusoidal grating is defined as a Michelson contrast:
where L max min
The stimuli used were horizontal sinusoidal gratings with an average luminance of 10 fL, that is, 34.4 cd/m², measured using an Optical OP200-E photometer (Cambridge Research) and a visual angle of 4°. The luminance output of the screen was calibrated using a luminance meter (LS-110, Konica Minolta Sensing, Inc., Osaka, Japan). Screen uniformity was checked at maximum output. The contrast of the sinusoidal grating is defined as a Michelson contrast:
where L
4
Characterization of Flexible OLED Electrodes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Raman measurements were carried out using a Raman microscopy system equipped with a 532 nm wavelength laser. Optical transmittance was measured with a UV-Vis-IR spectrophotometer (UV3600, SHIMADZU). Sheet resistance was measured using a four-point probe. The charge-carrier concentration was measured with a Hall Effect Measurement System (HL5500PC). A self-built bending test system was used to assess the bending properties of the composite electrode. The current-density–voltage–luminance (J–V–L) characteristics of the flexible-OLED were simultaneously measured using a source-meter (Agilent B2902A) and a Minolta luminance-meter (LS-110). The work function (WF) was measured with a Kelvin probe system. The surface roughness was measured with an atomic force microscope (Bruker Dimension Icon-PT).
5
Gamma-Corrected Visual Stimuli Presentation
6
Luminescence Properties of Phosphor Particles
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Optical properties of these materials were investigated by measuring emission and excitation spectra. The photoluminescence spectra of the phosphor particles were recorded with a spectrofluorometer (Fluorolog®-3, HORIBA Jobin Yvon) at RT. The emission spectrum was measured over the wavelength 400–650 nm, a Xenon arc lamp was used as excitation source (λexc = 380 nm). The decay profiles were also recorded using the same instrument after the samples were exposed to Solar Simulator, indoor artificial light and monochromatic light, λexc = 380 nm, for about 10 minutes. A relationship has been established between the luminescence intensity obtained by the spectrofluorometer and the luminace (cd/m2) obtained by using a luminance meter (LS-110, Konica Minolta Sensing, Inc.) and verifying the relationship following the approach by Clabau et al.36 . The radioluminescence measurements were obtained exciting the powders with Cu X-ray tube source on Rigaku Ultima+RINT2000/PC diffractometer and light collection was done using an Ocean Optics HR2000 spectrometer equipped with an optical fiber, the spectra were recorded at RT.
7
Optoelectronic Characterization of Thin Films
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The characteristics of current–voltage–luminance a were measured by a programmable Keithley model 2400 power supply and a Minolta Luminance Meter LS-110, respectively, in atmosphere conditions without any encapsulation for the devices. The spectra of the devices were obtained through Ocean Optics Maya 2000-PRO spectrometer.
The room temperature absorption/transmittance spectra were measured with an ultraviolet/visible spectrometer (UV 1700, Shimadzu) and the PL spectrum of the QDs in toluene was collected by a Hitachi F-4500 spectrophotometer under an excitation wavelength of 400 nm. The transmission electron microscopy (TEM) images were recorded on a Philips TECNAI G2 and the morphology of ZnO and AgNW films were characterized by scanning electron microscope (SEM) (Hitachi S4800). The sheet resistance (Rs) of AgNW film fabricated on a 2.5 cm × 2.5 cm glass/ZnO nanoparticle substrates was measured through four-point probe.
The room temperature absorption/transmittance spectra were measured with an ultraviolet/visible spectrometer (UV 1700, Shimadzu) and the PL spectrum of the QDs in toluene was collected by a Hitachi F-4500 spectrophotometer under an excitation wavelength of 400 nm. The transmission electron microscopy (TEM) images were recorded on a Philips TECNAI G2 and the morphology of ZnO and AgNW films were characterized by scanning electron microscope (SEM) (Hitachi S4800). The sheet resistance (Rs) of AgNW film fabricated on a 2.5 cm × 2.5 cm glass/ZnO nanoparticle substrates was measured through four-point probe.
8
Optoelectronic Characterization of Devices
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The voltage-current density, luminance and EL spectra were measured with a programmable source meter (Keithley 2400), luminance meter (LS110, Konica Minolta) and a spectrophotometer (Spectrascan PR670, Photo Research). The photoluminescence (PL) spectra and transient PL lifetime were measured by FLSP 920 spectrometer series.
9
Comprehensive Characterization of Organic Devices
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Electrical characteristics were measured by a Keithley 2400 instrument. The luminance of the devices was measured by a luminance meter (LS-110, Konica Minolta). Film thicknesses were characterized by field-emission scanning electron microscope (FESEM, JEOL JSM-7600F). The absorbance and fluorescence of Au NCs were analyzed by UV-vis absorption spectroscopy (Cary 50, Varian, USA) and PL spectroscopy (Fluoromax-3, Horiba). The absorbance spectra of the solid films and the electroluminescence spectra of the devices were recorded with a microspectrometer (SD1200‐LS‐HA, StreamOptics Co.). The thickness of organic layers are monitored by ET200 (Kosaka Laboratory Ltd.).
10
Luminance Characterization of Displays
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Displays were linearized in the standard fashion. We presented static test patches (384-by-384 pixels) at position 5 (Fig 2 , inset) on a black background (luminance = 0%). Using a spot meter (LS-110; Konica Minolta, Tokyo, Japan) we measured displayed luminance at 11 nominal luminances (spanning the range from black to white): 0, 10, 20 … 100%. We then fit a model of displayed luminance:
where x is the nominal luminance, and a and b are free parameters. We verified the fitted model, presenting luminances f−1(0), f−1(10), f−1(20) … f−1(100%) and ensuring the displayed luminances formed a zero-intercept straight line (e.g., seeFig 1 ).
where x is the nominal luminance, and a and b are free parameters. We verified the fitted model, presenting luminances f−1(0), f−1(10), f−1(20) … f−1(100%) and ensuring the displayed luminances formed a zero-intercept straight line (e.g., see
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!