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Su8220 field emission scanning electron microscope

Manufactured by Hitachi
Sourced in Japan

The SU8220 is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to produce high-resolution images of a wide range of samples. The SU8220 utilizes a field emission electron gun to generate a focused electron beam, which is then scanned across the sample surface to generate detailed images. The microscope is capable of achieving a high resolution and is suitable for a variety of applications.

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4 protocols using su8220 field emission scanning electron microscope

1

Scanning Electron Microscopy of Cells

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Cultures (1 ml) were centrifuged at ×1,200 g for 10 min, then 900 μL of the supernatant was discarded, and the remaining volumes (i.e. 100 μL) were fixed by adding 50 μL of 25% v/v glutaraldehyde (electron microscopy grade). Fixed cells were allowed to settle (40 min) on glass coverslips coated with 1% poly-L-lysine. Cells were rinsed with sterile media, and then dehydrated with a graded ethanol series (30–100%). The glass coverslips were then critical-point dried. Fixed cells were coated with gold/platinum using an ion sputter system. Specimens were examined with a SU8220 field emission scanning electron microscope (Hitachi, Tokyo, Japan) or JSM-6510LV scanning electron microscope (JEOL Ltd., Tokyo, Japan).
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2

Nanomaterial Characterization by SEM, XRD, TEM

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Scanning electron microscopy (SEM) images and elemental mapping were characterized by SU8220 field-emission scanning electron microscope (Hitachi Ltd, Japan, 10.0 kV). X-ray diffraction (XRD) was characterized by X’pert Powder X-ray diffraction (Panalytical. Ltd, Netherlands). Transmission electron microscope (TEM) images were recorded on a JEM-2100F field emission electron microscope (JEOL, Japan) at an accelerating voltage of 200 kV.
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3

Characterization of NPC1 and NPC2 Morphologies

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The morphologies of NPC1 and NPC2 were examined using a Hitachi SU8220 field-emission scanning electron microscope (Hitachi, Hitachi, Japan) operated at 20 kV and a Hitachi JEOL-2100 transmission electron microscope (Hitachi, Japan) operated at 200 kV. XRD patterns were obtained using an Ultima IV X-ray diffractometer (Rigaku, Tokyo, Japan) with Cu Kα radiation (λ = 0.1542 nm). FTIR spectra were recorded using a Nicolet 6700 spectrophotometer (Thermo Fisher, Waltham, MA, USA). N2 adsorption–desorption isotherms were measured using a Quadrasorb instrument (Quantachrome, Boynton Beach, FL, USA), and the samples were degassed for 12 h at 120 °C in an internal oven of the apparatus. Data were analyzed using the ASAP 2460 Quantachrome software. Raman spectra were recorded on a DXR Raman spectroscopy system (Thermo Fisher Scientific). XPS data were obtained using an Escalab 250Xi X-ray photoelectron spectrometer (Semmerfeld Technologies, Jacksonville, FL, USA). The pHzcN value at ΔpH = 0 was determined from the intersection point of the initial pH and final pH curves.
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4

Microscopic Imaging of Aquatic Microorganisms

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Live amoebae, flagellates, and cysts mounted on glass slides were observed with differential interference microscopy using a Leica DM5500B microscope equipped with a DFC550 digital camera (Leica, Wetzlar, Germany). Images were taken with this digital camera, and the dimensions of the organisms were measured using the LAS v.4.12 software (Leica Microsystems Ltd. Heerbrugg, Switzerland).
For scanning electron microscopy, cultures (800 μl) were fixed by adding 200 μl of 25% v/v glutaraldehyde (electron microscopy grade, Sigma-Aldrich, St. Louis, MO, United States), and incubated overnight at 4°C. Fixed cells were centrifuged at 5,000 × g for 30 min, and then 800 μl of the supernatants were discarded. Concentrated cells (200 μl) settled down on the glass coverslips coated with 1% poly-L-lysine for 1 h. Cells were then dehydrated using a graded ethanol series (50–100%). The glass coverslips were dried by adding a few drops of heated 2% ILs (1-Butyl-3-methylimidazolium tetrafluoroborate, Sigma-Aldrich, St. Louis, MO, United States) at 40°C onto the coverslip surface, followed by spinning at 3,000 × g for 5 s. The fixed cells were coated with platinum using an ion-sputter system. The specimens were subsequently examined under an SU8220 field emission scanning electron microscope (Hitachi, Tokyo, Japan).
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