Su8220 field emission scanning electron microscope
The SU8220 is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to produce high-resolution images of a wide range of samples. The SU8220 utilizes a field emission electron gun to generate a focused electron beam, which is then scanned across the sample surface to generate detailed images. The microscope is capable of achieving a high resolution and is suitable for a variety of applications.
Lab products found in correlation
4 protocols using su8220 field emission scanning electron microscope
Scanning Electron Microscopy of Cells
Nanomaterial Characterization by SEM, XRD, TEM
Characterization of NPC1 and NPC2 Morphologies
Microscopic Imaging of Aquatic Microorganisms
For scanning electron microscopy, cultures (800 μl) were fixed by adding 200 μl of 25% v/v glutaraldehyde (electron microscopy grade, Sigma-Aldrich, St. Louis, MO, United States), and incubated overnight at 4°C. Fixed cells were centrifuged at 5,000 × g for 30 min, and then 800 μl of the supernatants were discarded. Concentrated cells (200 μl) settled down on the glass coverslips coated with 1% poly-L-lysine for 1 h. Cells were then dehydrated using a graded ethanol series (50–100%). The glass coverslips were dried by adding a few drops of heated 2% ILs (1-Butyl-3-methylimidazolium tetrafluoroborate, Sigma-Aldrich, St. Louis, MO, United States) at 40°C onto the coverslip surface, followed by spinning at 3,000 × g for 5 s. The fixed cells were coated with platinum using an ion-sputter system. The specimens were subsequently examined under an SU8220 field emission scanning electron microscope (Hitachi, Tokyo, Japan).
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