Htk1200n
The HTK1200N is a high-temperature chamber from Bruker. It is designed for x-ray diffraction measurements at high temperatures up to 1200°C.
4 protocols using htk1200n
Thermal X-Ray Diffraction of Compound 1
In-situ and Operando X-ray Analysis of P2 Phase Synthesis
condition for the desired P2 phase, in situ X-ray
diffraction (XRD) for synthesis was performed using an HTK1200N temperature
chamber installed on a Bruker D8 Advance diffractometer. At each designed
temperature, the temperature was held for 1 h for the XRD pattern
collection. Operando XRD of the samples was performed
on the Bruker D8 Advance diffractometer equipped with a molybdenum
source (λ = 0.709 Å). The in situ cell
was charged/discharged within a voltage domain of 1.5–4.5 V
at a rate of C/30. Each scan covered a 2θ range of 6.5–23°
in a time duration of 5000 s. The electrochemical cell used for the operando XRD measurement is similar to those used in our
previous publication.28 (link) Selected powder
samples were also tested using the synchrotron radiation source (λ
= 0.4539 Å) at beamline 17-BM at the Advanced Photon Source (APS)
at Argonne National Laboratory (ANL). Some additional synchrotron
experiments were also performed using 28-ID-2 beamline of the National
Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory
and the 7-2 beamline of Stanford Synchrotron Radiation Lightsource
(SSRL). Morphological investigation and energy-dispersive X-ray spectroscopy
(EDS) mapping analysis of the samples was conducted using a field
emission scanning electron microscopy (FE-SEM, Zeiss, Ultra60).
Thermal Analysis of Material Composition
X-ray thermodiffractometry was performed under 5l.h -1 air flow in an Anton Paar HTK1200N of a D8 Advance Bruker diffractometer (- mode, CuKα radiation) equipped with a Vantec1 linear position sensitive detector (PSD). Each powder pattern was recorded in the range 5-60° (2) (at intervals of 20°C up to 800°C) with a 0.5 s/step scan, corresponding to an approximate duration of 30 mn.
Structural and Morphological Characterization
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