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Quantumike ip 65

Manufactured by Mitutoyo
Sourced in Japan

The QuantuMike IP 65 is a digital micrometer from Mitutoyo. It features a stainless steel frame and a LCD display. The micrometer has an IP65 protection rating, making it suitable for use in industrial environments.

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3 protocols using quantumike ip 65

1

Thickness and Mechanical Properties Measurement

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A digital micrometer (QuantuMike IP 65, Mitutoyo, Japan) with an accuracy of 1 μm was used to measure the thickness of the film samples [40 (link)].
The mechanical properties were measured using an Instron Universal Testing Machine (Model 5565, Instron Engineering Corporation, Canton, MA, USA) following the standard ASTM method D 882-88. The machine was operated with an initial grip separation of 50 mm and a crosshead speed of 50 mm/min using a 500 N load cell [27 (link)].
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2

Measuring Film Thickness and Mechanical Properties

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The film’s thickness was measured using a hand-held digital micrometer (Digimatic Micrometer, QuantuMike IP 65, Mitutoyo, Japan) with an accuracy of 1 μm. The film thickness was measured at five random locations of each film, and their average value was reported. Each film’s mechanical properties were determined according to the standard method of ASTM D 882-88 using an Instron Universal Testing Machine (Model 5565, Instron Engineering Corporation, Canton, MA, USA). For the measurement, the film sample was cut with (2.54 × 15 cm) dimension using a precision double blade cutter (model LB.02/A, Metrotec, S.A., San Sebastian, Spain) [31 (link)]. The machine was operated in the tensile mode with an initial grip separation and crosshead speed set at 50 mm and 50 mm/min, respectively.
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3

Tensile Properties of Starch Film Strips

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Tensile properties of 125 mm × 12.5 mm starch film strips (with twelve replicates) were measured according to method ASTM D882-01 [21] , using an EMIC DL30000 Universal Mechanical Test Machine with a load cell of 100 N, initial grip separation of 100 mm, and deformation speed of 12.5 mm⋅min -1 . The thickness (mm) was measured at 6 random points of each film specimen using a micrometer (Quantumike IP 65, Mitutoyo, Kawasaki, Japan, with an accuracy of 1 μm), before characterization tests.
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