Sem ga fib fei helios nanolab 600i
The SEM/Ga-FIB FEI Helios NanoLab™ 600i is a high-performance scanning electron microscope (SEM) and gallium-focused ion beam (Ga-FIB) system. It combines advanced imaging and analysis capabilities for nanoscale materials characterization and sample preparation.
Lab products found in correlation
2 protocols using sem ga fib fei helios nanolab 600i
Structural Analysis of Impregnated Membranes
Encapsulation and Characterization of Carriers
Electronic caliper 150 × 0.01 mm (Asimeto, Weißbach, Germany), Camera Microscope Digimicro Lab. 5.0 (Toolcraft, Georgensgmünd, Germany), SEM/Ga-FIB FEI Helios NanoLab™ 600i (FEI, Thermo Fisher Scientific, Eindhoven, The Netherlands), and eZT dynamometer (Imada, Aichi, Japan) were used to carriers characterization.
UV–VIS Spectrophotometer UV-1280 (Shimadzu, Kioto, Japan) was applied in the drug concentration determination.
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