Nova nano sem 450
The Nova Nano-SEM 450 is a scanning electron microscope (SEM) designed for high-resolution imaging of a wide range of materials. It features a field emission gun (FEG) electron source and advanced optics to provide exceptional image quality and resolution. The Nova Nano-SEM 450 is capable of operating at low voltages, making it suitable for imaging of delicate and non-conductive samples.
Lab products found in correlation
3 protocols using nova nano sem 450
Comprehensive Characterization of Composite Beads
Characterization of Al Nanowires
Characterization of NZC-g-PANI Nanocomposite
(FTIR)
spectra of bare NLP, bare ZnO NPs, and the NZC-g-PANI
nanocomposite (before and after MO and BG dye adsorption) were investigated
in the range of 4000–400 cm–1 using a Perkin
Elmer (Nicolet 6700, Thermo Fisher). High-resolution field emission
scanning electron microscopy (HR FESEM) was used to record the microstructure
of the NZC-g-PANI nanocomposite (before and after
dye adsorption) employing a Zeiss NOVA NANOSEM-450 field emission
scanning electron microscope. The NZC-g-PANI nanocomposite
was also analyzed using a transmission electron microscope (JEM 2100,
JEOL, Japan) instrument operating at 200 kV. Raman spectra of the
samples were carried out at room temperature by an inVia Reflex Raman
Microscope (Renishaw, United Kingdom) with the samples deposited on
the glass slides. X-ray diffraction (XRD) measurements were performed
on a Rigaku D/max-RA X-ray diffractometer. The diffracted intensity
of the Cu Kα radiation (λ = 0.154 nm, 45 kV, 40 mA) was
evaluated in the 5–80° 2θ range. The dye concentrations
in the treated samples were determined using a spectrophotometer (Shimadzu
UV-2450, Japan). The pH at the point of zero charge (pHpzc) was determined using a change in pH approach with a pH meter (ANALAB
Scientific pH/ORP Analyzer).
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