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Nova nano sem 450

Manufactured by Zeiss
Sourced in United States

The Nova Nano-SEM 450 is a scanning electron microscope (SEM) designed for high-resolution imaging of a wide range of materials. It features a field emission gun (FEG) electron source and advanced optics to provide exceptional image quality and resolution. The Nova Nano-SEM 450 is capable of operating at low voltages, making it suitable for imaging of delicate and non-conductive samples.

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3 protocols using nova nano sem 450

1

Comprehensive Characterization of Composite Beads

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SEM-EDS images of the composite beads were obtained using an FEI Nova Nano-SEM 450 (Hillsboro, OR, USA) and Zeiss GeminiSEM 300 (Oberkochen, Germany). The phase structural properties of the obtained materials were determined by XRD diffraction patterns in the range of 5° to 70° at a scan rate (2θ) of 2°/min using a Bruker D8 Advance Powder Diffractometer (Cu-Kα radiation) (Billerica, MA, USA). The metal coordination state with the composite beads was analyzed by XPS analysis using ThermoFisher K-Alpha equipment with Al-Kα radiation (hv = 1486.6 eV) (Waltham, MA, USA). FTIR results in the range of 4000–650 cm−1 were obtained using a Thermo-Fisher IS50. The TGA results were from a thermogravimetric analyzer (NETZSCH STA 449F5, Selb, Germany) under air atmosphere from 30 °C to 800 °C at a heating rate of 10 °C/min. The specific surface area, total pore volume, and average pore radius were determined by nitrogen adsorption at −196 °C (outgassing was performed at room temperature) using a Quantachrome Autosorb iQ gas sorption analyzer system (Boynton Beach, FL, USA). A LakeShore Company (Westerville, OH, USA) vibrating sample magnetometer (model 7404) was used to investigate the magnetic properties of the composite sample. A Bruker A300 spectrometer was used to study the reactive oxygen species (ROS) generated in the reaction system.
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2

Characterization of Al Nanowires

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The template-free electrodeposited Al nanowires were characterized by scanning electron microscopy (SEM, FEI, Hillsboro, OR, USA, NOVA NanoSEM 450 and ZEISS, Oberkochen, Germany, GeminiSEM 500), transmission electron microscopy/high-resolution transmission electron microscopy (TEM/HRTEM, JEOL, Akishima, Japan, JEM-2100 and JEM-2100F) and selected area electron diffraction (SAED, JEOL, Akishima, Japan, JEM-2100 and JEM-2100F).
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3

Characterization of NZC-g-PANI Nanocomposite

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The Fourier transform infrared
(FTIR)
spectra of bare NLP, bare ZnO NPs, and the NZC-g-PANI
nanocomposite (before and after MO and BG dye adsorption) were investigated
in the range of 4000–400 cm–1 using a Perkin
Elmer (Nicolet 6700, Thermo Fisher). High-resolution field emission
scanning electron microscopy (HR FESEM) was used to record the microstructure
of the NZC-g-PANI nanocomposite (before and after
dye adsorption) employing a Zeiss NOVA NANOSEM-450 field emission
scanning electron microscope. The NZC-g-PANI nanocomposite
was also analyzed using a transmission electron microscope (JEM 2100,
JEOL, Japan) instrument operating at 200 kV. Raman spectra of the
samples were carried out at room temperature by an inVia Reflex Raman
Microscope (Renishaw, United Kingdom) with the samples deposited on
the glass slides. X-ray diffraction (XRD) measurements were performed
on a Rigaku D/max-RA X-ray diffractometer. The diffracted intensity
of the Cu Kα radiation (λ = 0.154 nm, 45 kV, 40 mA) was
evaluated in the 5–80° 2θ range. The dye concentrations
in the treated samples were determined using a spectrophotometer (Shimadzu
UV-2450, Japan). The pH at the point of zero charge (pHpzc) was determined using a change in pH approach with a pH meter (ANALAB
Scientific pH/ORP Analyzer).
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