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Fei teneo lv scanning electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The FEI Teneo LV Scanning Electron Microscope is a high-resolution imaging system designed for materials analysis and characterization. It provides detailed visualization of surface topography and microstructural features at the nanometer scale.

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Lab products found in correlation

2 protocols using fei teneo lv scanning electron microscope

1

Ultrastructural Analysis of Murine Lens in Uveitis

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For SEM analysis lenses were isolated from the eyes of normal mice and mice with EAU and the vitreous gently removed from the lenses prior to fixation in sodium cacodylate buffer containing 2.5% of glutaraldehyde and 1% of paraformaldehyde. Three control and 6 uveitic lenses were used per time point analyzed. The samples were rinsed and then postfixed in 1% osmium tetroxide. Serial dehydration in ethyl alcohol was followed by critical point drying (Autosamdri‐931, Tousimis, Rockville, MD, USA). A thin layer of gold was sputtered onto the surface of the samples (Cressington 208HR, Ted Pella Inc, Redding, CA, USA) before imaging them in the FEI Teneo LV Scanning Electron Microscope (Thermo Fisher, Hillsboro, OR, USA). Imaging conditions were 2.0 KV with a working distance of 8.7 mm using the Everhart Thornley detector.
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2

Scanning Electron Microscopy of Lens Samples

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Lenses were fixed in 2.5% of glutaraldehyde and 1% of paraformaldehyde in sodium cacodylate buffer. After rinsing, the samples were postfixed in 1% of osmium tetroxide. A serial dehydration in ethyl alcohol was followed by critical point drying (Autosamdri‐931, Tousimis, Rockville, MD). A thin layer of gold was sputtered onto the surface of the samples (Cressington 208HR, Ted Pella Inc, Redding, CA) before imaging in the FEI Teneo LV Scanning Electron Microscope (Thermo Fisher, Hillsboro, OR). Imaging conditions were 2.0 KV with a working distance of 8.7 mm using the Everhart Thornley detector.
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