Axis ultra dld x ray photoelectron spectroscopy

X-ray diffraction (XRD) was operated at 35 kV and 200 mA with Nickel-filtered Cu-Kα radiation as incident beam (D/max 2550VL/PC), to study the crystallization of carbon and other phases contained in the samples. Typical transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM) with a cold field emission gun (JEOL-2010F) were used to investigate the microstructure and morphology of the samples. Energy-dispersive X-ray spectroscopy (EDS, Oxford INCA 200 attached to the HRTEM instrument) was also employed to analyze elemental compositions. Raman spectroscopy was used to examine the perfection of the hollow CNCs using a Horiba Yvon HR 800UV with a 514.5 nm excitation wavelength laser. Thermogravimetric analysis (TGA) (TGA/SDTA/DSC851e) was conducted by heating samples to 900°C at 10°C min⁻¹ in an air atmosphere. The surface of the CNCs was analyzed with Kratos Axis Ultra DLD X-ray photoelectron spectroscopy (XPS). This system uses a focused monochromated Al Kα (15 kV) X-ray source for excitation and a spherical section analyzer at a base pressure of 10⁻⁹ Torr. The peak energies were calibrated by placing the major C1s peak at 284.8 eV.

X-ray diffraction (XRD) patterns were recorded by a Bruker D8 Advanced X-ray diffractometer with a Cu Kα (1.5 Å) source. Field scanning electron microscopy (SEM) images were obtained with a Hitachi S-4800 SEM. The absorbance (OD) values of bacteria solution were measured by Agilent UV-Vis 8453 Ultraviolet-visible spectrometer. Particles surface charges were analyzed by Malvern Zetasizer Nano ZS90 dynamic light scattering instrument (DLS). The surface elements of the samples were conducted by Kratos AXIS Ultra DLD X-ray Photoelectron Spectroscopy (XPS). Sample functional groups were recorded using Nicolet NEXUS 6700 Fourier transform infrared (FTIR) spectrometer. Fluorescence spectra of the samples were collected by Hitachi F-7000 Fluorescence spectrophotometer.