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Gemini sem 300 instrument

Manufactured by Zeiss
Sourced in Germany

The Gemini SEM 300 is a scanning electron microscope (SEM) designed and manufactured by Zeiss. The core function of this instrument is to produce high-resolution images of sample surfaces by scanning them with a focused beam of electrons. The Gemini SEM 300 utilizes a field emission electron source, which provides high brightness and small probe size, enabling detailed visualization of various materials and structures at the nanometer scale.

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3 protocols using gemini sem 300 instrument

1

Synthesis and Characterization of tert-Butyldihomooxacalix[4]arenes

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All reagents and solvents were commercially available in analytical grade and used as received. Further purification and drying by standard methods were employed, and distillation was done prior to use when necessary. All evaporations of organic solvents were carried out with a rotary evaporator in conjunction with a water aspirator. p-tert-Butyldihomooxacalix[4]arenes were prepared according to published methods (Marcos et al., 2002 (link)). Melting point measurements were taken on a hot-plate microscope apparatus and are uncorrected. 1H and 13C NMR spectra were recorded with an Aviance III 400 MHz or 600 MHz liquid-state NMR spectrometer. IR spectra were obtained on a Bruker Tensor 27 spectrophotometer (KBr disk). HRMS was determined on a Bruker maXis mass spectrometer. Fluorescence spectra were recorded on a Shimadzu HITACHI F-4500 spectrophotometer. Rheological studies were performed on an AR-G2 rheometer (TA Instruments, USA) using a plate–plate geometry. The SEM image was obtained from a ZEISS Gemini SEM 300 instrument.
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2

Comprehensive Material Characterization Protocol

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The XRD patterns were obtained on a Bruker D8 X-ray diffractometer (BRUKER AXS GMBH, Karlsruhe, Germany). Fourier transform infrared spectra and in situ infrared spectra were recorded on a Bruker Tensor II infrared spectrometer (Bruker, Karlsruhe, Germany). SEM images were obtained on a ZEISS GeminiSEM 300 instrument (ZEISS, Oberkochen, Germany). TEM images and elemental mapping images were recorded on a JEOL JEM-F200 transmission electron microscope (JEOL, Tokyo, Japan). XPS spectra were performed on a Thermo Scientific K-Alpha instrument (Thermo Fisher Scientific, Waltham, MA, USA). Ultraviolet-visible diffuse reflectance spectra were analyzed by a TU-19 spectrophotometer (PERSEE ANALYTICS, Beijing, China). N 2 adsorption and desorption curves were obtained on a Tristar II physical adsorption instrument (Micromeritics, Norcross, GA, USA). Time-resolved fluorescence spectra (TRPL) were analyzed on an Edinburgh FLS 1000 spectrometer (Edinburgh Instruments, Livingston, UK).
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3

Characterization of Pac-Man Morphology Particles

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The Pac-Man morphology of these particles is observed using a scanning electron microscope (Zeiss Gemini SEM 300 instrument). The particles are also characterized by a powder X-ray diffractometer (Bruker 2D phaser powder X-ray diffractometer, Cu Kα radiation (30 kV, 10 mA) in the 2θ range of 5°to 100°), Fourier-transform infrared spectrometer (Thermo Scientific -Nicolet 8700 with attached Thermo Scientific Smart iTR in Attenuated Total Reflectance (ATR) mode) and diffuse reflectance spectrophotometer (Cary 5000 UV-Vis-NIR spectrophotometer), results are shown in the ESI, Fig. S1. †
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