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Evo 15 scanning electron

Manufactured by Zeiss
Sourced in Germany

The Zeiss EVO 15 is a scanning electron microscope that uses a focused beam of electrons to generate high-resolution images of surface features on a wide range of samples. It provides detailed information about the topography, composition, and structure of materials at the micro- and nanoscale level.

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2 protocols using evo 15 scanning electron

1

Ultrastructural Analysis of Nasal Epithelium

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At necropsy, samples from the nasal cavity (cranial and caudal conchae, septum) were collected for scanning electron microscopy (SEM). Samples were fixed in 5% glutaraldehyde buffered with 0.1 M cacodylate buffer (Serva Electrophoresis) and were subsequently embedded by a modified osmium (O)-thiocarbohydrazide (T)-embedding (OTOTO) protocol, followed by critical-point-drying and coating with gold in a sputter-coater (SCD040, Oerlikon Balzers), as described previously.10
Embedded samples were mounted on 0,5” Aluminum Specimen Stubs (Agar Scientific) using 12 mm Leit-Tabs (Plano) and Conductive Carbon Cement after Göcke (Plano) and examined using a Zeiss EVO 15 scanning electron microscope (Carl Zeiss Microscopy) operating with 10 kV.
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2

Neutrophil Ultrastructural Analysis Under Hypoxia

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Neutrophils were harvested, seeded on glass cover slips, and stimulated with either RPMI, MβCD, or Simvastatin as stated above. After 3 h incubation under either hypoxia or normoxia, cells were fixed in 1.5% glutaraldehyde (Sigma-Aldrich Chemie GmbH, St. Louis, MO, USA) and 3% PFA, buffered with 0.1 M cacodylate buffer (Serva Electrophoresis, Heidelberg, Germany) for 24 h and subsequently washed with 0.1 M cacodylate buffer. For further processing, the samples were embedded with 1% osmium tetroxide (Science Services GmbH, Munich, Germany) and dehydrated in a series of graded ethanol, followed by critical-point-drying and coating with gold in a sputter-coater (SCD040, Oerlikon Balzers), as described previously [44 (link),45 (link)] Afterward, the samples were mounted on 0.5” Aluminum Specimen Stubs (Agar Scientific, Stansted, Essex, UK) using 12 mm Leit-Tabs (Plano) and examined using a Zeiss EVO 15 scanning electron microscope (Carl Zeiss Microscopy, Oberkochen, Germany) operating with an acceleration voltage of 10 kV.
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