The method used in this study was based on the surface profile method (BS 5136)5 to quantify the degree of surface wear as cross-sectional area of worn dentin and enamel specimens. They were brushed with 2:1 slurry mixture of the artificial saliva solution and each dentifrice underwent 27,375 (Step 1); 54,750 (Step 2); 82,125 (Step 3); and 109,500 double strokes (Step 4) in succession by brushing machine at 250 gF. The abrasion depth was measured by a profilometer (Mitutoyo SV-3000; Mitutoyo, Tokyo, Japan). The depth was calculated (from plots of wear surface) by dividing the full length of the wear surface area into 10 equal parts, summing the length of 9 places (except for both end lengths of the 10 parts), and dividing by 9.
Sv 3000
Manufactured by Mitutoyo
Sourced in Japan
The Mitutoyo SV-3000 is a surface roughness measurement instrument. It is designed to measure the surface roughness of various materials, including metals, plastics, and ceramics. The instrument uses a stylus to trace the surface of the workpiece and provides detailed information about the surface profile, including parameters such as average roughness (Ra) and root-mean-square roughness (Rq).
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Lab products found in correlation
5 protocols using sv 3000
1
Quantifying Dental Abrasion Depth
2
Surface Roughness Analysis of Y-TZP
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To compare the surface roughness of the Y-TZP after the surface treatments, it was analyzed using a surface roughness tester (SV-3000, Mitutoyo, Tokyo, Japan) (3 per non-thermal cycled group). The surface roughness tester was used with the diamond stylus to move along a length of 5 mm at a speed of 0.2 mm/s.
3
Characterizing Surface Roughness-Wettability Relationship
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To compare the relationship between surface roughness and wettability [16 (link)] of the 3Y-TZP specimens after the surface treatments, the specimens were analyzed using a surface roughness tester (SV-3000, Mitutoyo, Tokyo, Japan) (one per group) and a surface electro optics instrument (PHX-300 Touch, Surface Electro Optics, Suwon, Korea) (3 per group). The surface roughness tester was used with the diamond stylus to move along a 5 mm length at a speed of 0.2 mm/s, and the surface electro optics instrument was used by the sessile drop method on the specimen surface after placing a droplet of distilled water for 5 s. The contact angle was analyzed using the Sufaceware8 software (Surface Electro Optics, Suwon, Korea).
The morphology of the specimens after the surface treatments was observed by field emission scanning electron microscopy (FE-SEM; SU-70, Hitachi, Tokyo, Japan) (1 per group) and atomic force microscopy (AFM; Multimade-8, Bruker, Billerica, MA, USA) (1 per group).
The morphology of the specimens after the surface treatments was observed by field emission scanning electron microscopy (FE-SEM; SU-70, Hitachi, Tokyo, Japan) (1 per group) and atomic force microscopy (AFM; Multimade-8, Bruker, Billerica, MA, USA) (1 per group).
4
Fabrication of B-rGO Thin Film Sensor
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The gold-coated glass (AU. 0500. ALSI, City, Fitchburg, WI, USA) with a uniform thickness of 50 nm Au layer was purchased from Platypus Technology, USA. The thickness of the Au layer was further confirmed by the surface roughness tester (SV 3000, Mitutoyo, Aurora, IL, USA). The B-rGO dispersion solution (0.25 mg/mL) in NMP was attained after the 1 h sonication process, using the probe sonicator. After that, the unexploited flakes of B-rGO were removed by the centrifuge process at 6000 rpm for 10 minutes. The Au-coated glass was washed with DI water before the deposition of the B-rGO layer. The uniform B-rGO thin film was attained by using a spin-coating technique at the rotation speed of 4,500 rpm followed by its thickness measurement using the surface roughness tester. Later, the sensing layer coated on top of the gold film was attached to the SF11 prism using the Norland index matching liquid, Newport to prepare the sensor chip.
5
Surface Roughness and Composition Analysis
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The centerline average roughness (R a) of the treated surface of each specimen was measured by a profilometer (SURFTEST SV-3000, Mitutoyo, Kawasaki, Japan). Seven different readings were taken with a traveling distance of 2 mm across the treated surface. After completing the measurements, the maximum and minimum values were removed, and the remaining five values were used to calculate the R a of the specimen. A lower Ra value indicates a smoother surface.
The phase composition of the specimens was investigated by a multi-purpose high-performance X-ray diffractometer (X'pert Powder, PANalytical, Almelo, the Netherlands) using Cu Kα radiation, tube voltage 40 kV, and tube current 30 mA. In the range of 20≤2θ≤40 with a step size of 0.033° and a measuring time of 5 s at each step.
The phase composition of the specimens was investigated by a multi-purpose high-performance X-ray diffractometer (X'pert Powder, PANalytical, Almelo, the Netherlands) using Cu Kα radiation, tube voltage 40 kV, and tube current 30 mA. In the range of 20≤2θ≤40 with a step size of 0.033° and a measuring time of 5 s at each step.
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