Jdx 8030
The JDX-8030 is a X-ray Diffractometer (XRD) manufactured by JEOL. It is designed for the analysis of crystalline materials and their structures. The JDX-8030 utilizes X-ray diffraction technology to provide information about the atomic and molecular structure of a sample.
Lab products found in correlation
9 protocols using jdx 8030
Alg@SBA-15/Fe3O4 Catalyst Characterization
Comprehensive Characterization of Nanomaterials
TESCAN). EDX analysis was recorded on Numerix DXP-X10P. The transmission electron microscopy (TEM) was provided on a Philips CM200.
Comprehensive Characterization of Solid Samples
Synthesis and Characterization of Novel Materials
Comprehensive Characterization of CuO Nanoparticles
Synthesis and Characterization of Magnetic Chitosan Nanocomposite
Comprehensive Material Characterization Protocol
Antibacterial Bionanocomposite Characterization
Multifaceted Analysis of Urinary Stones
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!