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77 protocols using lambda 650

1

Characterization of Nanofibrous Photocatalyst

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Physical and
chemical characteristics of nanofibrous membrane were characterized
by scanning electron microscopy (SEM, SU5000, 10 kV, working distance
at 5 mm; SEM–EDX, 20 kV, working distance at 10 mm) and high-resolution
transmission electron microscopy (HR-TEM, JEOL JEM-2010). Band gap
(Eg) of TiO2-ZnWO4 photocatalyst was measured by UV–vis spectrophotometer (Perkin
Elmer, model: Lambda 650) and calculated with the Tauc plot.52 (link)−54 (link) XRD patterns were collected in a range from 10 to 80° 2θ
with a Cu source (λ = 1.54 Å; 40 kV; 40 mA) by X-ray diffractometer
(Bruker, D8 Advance). Thermogravimetric analysis (TGA) was conducted
under air at a heating rate of 2 °C/min from room temperature
to 1100 °C (Shimadzu/DTG-60AH). Toluene concentration was measured
using gas chromatography/mass spectroscopy (GC/MS: QP2010 Ultra, library:
NIST14, column: DB-5, Shimadzu). MB concentration was measured via
UV–vis spectrophotometer (Perkin Elmer, model: Lambda 650).
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2

Efficient Drug Loading and Release Profiles

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The loading efficiency and releasing curves of MI and 5-FU in the MGO/FU-MI NCs were determined using UV–vis spectrophotometer (Lambda 650S, PerkinElmer). Firstly, a series of deionized water solutions with different MI and 5-FU concentrations were prepared to obtain the calibration curve. Then, the absorbances of 5-FU and MI of the solutions at the beginning and end of the synthesis were detected to calculate the reduced parts, which corresponded to the amount loaded on the NCs. And the loading efficiency and capacity was calculated using the following formulae [16 (link)]: Loadingefficiency(%)=(theweightofloadingdrugtheweightofdrugtofeed) and Loadingcapacity(%)=(theweightofloadingdrugtheweightofNCs).
The loading efficiencies and capacity were 25.03% and 12.3% for MI and 27.76% and 9.5% for 5-FU on MGO/FU-MI NCs respectively in the present synthesis. Moreover, the releasing profiles of MI and 5-FU were obtained through detecting the absorbances of PBS solutions with different PH, which contained 500 µg ml−1 NCs and were incubated for 1, 3, 6, 12, 24 h.
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3

Structural and Optical Characterization of Deformed ZnO Films

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Morphological analyses have been performed via scanning electron microscopy (QUANTA 400 F Field Emission SEM). Images of both flat and strained ZnO films have been captured in order to determine the effect of deformation. The crystal structures of synthesized ZnO nanostructures have been determined by X-Ray Diffraction (XRD) analysis. XRD analysis has been performed via the PANalytical/Philips X’Pert MRD system. The flexibility of ZnO films have also been tested, and the changes in film characteristics have been investigated deeply. UV/Vis (Perkin Elmer, Lambda 650 S) has been used for the reflectance measurements in order to determine the optical changes after straining.
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4

Characterization of Thin Film Materials

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The sheet resistances were measured using a sheet resistance meter (FPP-40K, DASOL ENG) and were obtained by measuring nine points on the substrate and determining the mean value and the standard deviation. The absorption spectra were measured by using an ultraviolet-visible spectrometer (Lambda 650S, Perkin Elmer). The surface chemical compositions were measured by using XPS (XPS-Theta Probe, Thermo Fisher Scientific Co.). The structure and the chemical composition were investigated by using SEM (NOVA NANOSEM 450, FEI), TEM, and EDS (JEM-2100F, JEOL).
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5

Comprehensive Material Characterization Techniques

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X-ray diffraction
(XRD) patterns were collected on a Bruker D8 diffractometer using
Cu Ka radiation with a scan range of 5–80° at a scan rate
of 6 ° min–1. The morphology of the samples
was characterized using an FEI QUANTA 200 emission scanning electron
microscope (FESEM). Transmission electron microscopy (TEM), high-resolution
TEM (HRTEM) images, and elemental distributions were acquired through
a JEOL JEM-2100 F (UHR) field emission transmission electron microscope.
UV–vis diffuse reflectance spectra (DRS) data for the samples
were obtained with a UV–vis spectrometer (PerkinElmer Lambda
650 s), using BaSO4 as a reference. X-ray photoelectron
spectroscopy (XPS) measurements were determined with a Thermo Scientific
ESCALAB 250 XI X-ray photoelectron spectrometer (Al Ka, 150 W, C 1s
284.8 eV). PL spectra were measured by a spectrophotometer (F-4600
FL) at room temperature.
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6

Adsorption of Congo Red on Treated Hollow Spheres

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For adsorption
tests, 30 mg of the treated hollow spheres was added into 100 mL of
CR solution after they were treated in HCl solution at pH 4 for 2
h. The static adsorption of CR was carried out at different initial
concentrations of CR solution at pH 4 and 25 °C. At appropriate
time intervals, the analytical mixture was collected and separated.
The remaining CR concentration in the aqueous phase was determined
using an UV–visible spectrophotometer (Lambda 650S, PerkinElmer)
around a wavelength of 500 nm. Adsorption capacity of CR on the spheres
at time t (qt) and at equilibrium (qe) was calculated
using the following eqs 1 and 2, respectively. where C0, Ct, and Ce (mg/L) are the concentrations of CR initially, at time t and at equilibrium, respectively. V (L)
is volume of solution, and M (g) is mass of hollow
spheres.
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7

Characterizing Thin Film Properties

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The sheet resistances were measured by using a sheet resistance meter (FPP-40K, DASOL ENG) and were obtained by measuring nine points on the substrate and determining the mean value and the standard deviation. The transmittance spectra were measured by using a UV-visible spectrometer (Lambda 650 S, Perkin Elmer). The structural properties were investigated by using SEM (NOVA NANOSEM 450, FEI) while the surface chemical compositions were measured by using XPS (XPS-Theta Probe, Thermo Fisher Scientific Co.).
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8

Quantitative Analysis of Retinal

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After extraction, the absorption spectra of retinal in the supernatant were recorded with a Lambda 650 S UV-visible spectrometer (Perkin Elmer, Uberlingen, Germany) at 25 °C in the range of 250–500 nm using a quartz cuvette with 10 mm path length (Quartz Suprasil, Hellma Analytics, Müllheim, Germany). The band maximum of the retinal is at 380–400 nm. The results obtained from the skin probes from PRN-loaded MN, PRN and conv. RAL were compared with the untreated skin areas, which served as control. The amount of recovered retinal in epidermis and dermis from all formulations was calculated using the standard reference curve prepared of retinal standards.
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9

Optical and Mechanical Characterization of Metamaterials

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UV-VIS-NIR light transmittance and reflectance at wavelengths of 300–2500 nm were measured using a UV-visible spectrometer with an integrating sphere (Lambda 650 S, Perkin Elmer), and IR light transmittance and reflectance in the wavelengths of 2.5–25 μm region were measured using a Fourier transform infrared spectrometer (Nicolet 6700, Thermo Scientific). All samples had a thickness of 50 μm unless otherwise mentioned. The haze in visible light was calculated by dividing the diffuse transmittance by the total transmittance66 (link). The diffuse and total transmittances were measured according to the ASTM D1003 method. To quantify the mechanical properties of the metamaterials, tensile tests were performed using a universal testing machine with a 100 N load cell at a speed of 0.1 mm/min. Dogbone-shaped specimens were prepared according to the ASTM D 412 standard. To evaluate the moisture-impermeable properties of the metamaterials, the water vapor transmission rate was measured using a permeation testing system (Permatran-W 3/33 MA, Mocon) at room temperature and at a relative humidity of 100% according to the ASTM F1249 method.
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10

Electrical and Optical Characterization of Thin Films

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The electrical measurements were performed using a semiconductor analyzer system (4200, Keithley), an oscilloscope (TDS 2024 C, Tektronix) and a waveform generator (33220 A, Agilent) in an atmospheric environment at room temperature. In the electrical measurements, all of the bias voltages were applied to the top Al electrodes while keeping the bottom Al electrodes grounded. SEM image was obtained by using Nova Nano SEM 230 system. The absorption spectra of the films were characterized by using an UV–Vis spectrophotometer (Lambda 650 S, Perkin Elmer). The UPS measurements were performed in an analysis chamber using a He discharge lamp (XPS-Theta Probe, Thermo Fisher Scientific). The resolution of the measurements was 50 meV.
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