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8 protocols using v 670 uv vis nir spectrometer

1

Characterization of gold nanoparticle uptake

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Absorption spectra were recorded using a Jasco V-670 UV-Vis-NIR spectrometer with a slit width of 2 and 1 nm spectral resolution. Particle size distribution and zeta potential were measured by a Zetasizer NanoZS90 instrument (Malvern Instruments). Analysis was performed at a scattering angle of 90° and temperature of 25 °C. Dark field images of OCI-AML3 and THP1 cells incubated with GNP-MDS-Pl were acquired using an inverted Zeiss Axio Observer Z1 microscope. To capture the cells, a few microliters of cell suspension were dropped onto an Ibidi μ-Dish and enclosed with a cover slip. A 100-W halogen lamp was used for illumination which was focused on the sample using a high numerical immersion condenser (NA = 1.4), and the scattered light was collected by an LD Plan-Neofluar ×20 objective (NA = 0.4, Zeiss).
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2

Characterization of Drug-Loaded Nanoparticles

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UV-Vis-NIR extinction spectra of free and drug-loaded nanoparticles were acquired using a JASCO V-670 UV-Vis-NIR spectrometer at 1-nm spectral resolution in 2-mm path length quartz cuvettes. Particle size distribution and zeta potential were measured at 25°C using the Zetasizer Nano ZS90 from Malvern Instruments. Analysis was performed at a scattering angle of 90° and a temperature of 25°C. Particle morphology was imaged by transmission electron microscopy using a JEOL model JEM 1010 microscope.
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Comprehensive Characterization of Carbon Quantum Dots

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The JASCO V-670 UV–VIS-NIR spectrometer with wavelength range of 200–800 nm, was used to obtain the ultraviolet–visible (UV–Vis) absorption spectrum of CQDs. Meanwhile, Hitachi F-700 Fluorescence spectrometer with excitation wavelength ranging from 300 to 500 nm was utilized to measure the fluorescence emission spectra. Rigaku Smartlab SE was employed to acquire the X-ray diffraction (XRD) pattern through irradiation of Cu Kα ( λ  = 0.15406 nm) at 30 mA and 40 kV, and 40° min−1 scan rate. Energy-dispersive X-ray (EDX) spectroscopy was performed with JOEL JSM-IT500 to check the purity and elemental composition of the CQDs. Horiba SZ-100 was harnessed for measuring the zeta potential and the hydrodynamic size of the particles in solution by dynamic light scattering (DLS). Confirmation of particle size and morphological study was done using transmission lectron microscopy (TEM - JEOL JEM-2100 Plus). Fourier transform-infrared spectroscopy (FT-IR) was performed over the range of 4000–400 cm-1 using Nicolet iS10 FTIR spectrophotometer.
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4

Optical Characterization of Nanoparticles

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The optical response of the prepared nanoparticles was characterized by means of UV–Vis absorption spectroscopy. Absorption spectra were recorded using a Jasco V-670 UV–Vis–NIR spectrometer (Jasco, Easton, MD, USA) with a slit width of 2 and 1 nm spectral resolution. Particle size distribution and zeta potential were measured using a Zetasizer NanoZS90 instrument (Malvern Instruments, Malvern, UK). Analysis was performed at a scattering angle of 90° at 25°C (Figure S1).
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5

Structural Characterization of Molecular Compounds

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X-ray fluorescence spectrometry was performed on a SHIMADZU EDX-7000 spectrometer. IR spectra were recorded on a JASCO FT/IR-4700 infrared spectrophotometer using the ATR method at room temperature. Solid-state diffuse reflection spectra were measured on a JASCO V-670 UV/Vis/NIR spectrometer and solid-state CD spectra were recorded on a JASCO J-820 spectrometer at room temperature. Elemental analyses (C, H, N) were performed at Osaka University using a Yanaco CHN Corder MT-6. The powder X-ray diffractions were recorded at a controlled temperature in transmission mode [synchrotron radiation λ = 1.0 Å; 2θ range = 2–78°; step width = 0.01°; data collection time = 1 min] on a diffractometer equipped with a MYTHEN microstrip X-ray detector (Dectris Ltd) at the SPring-8 BL02B2 beamline. The crystals were loaded into a glass capillary tube (diameter = 0.3 mm), which was rotated during the measurements.
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6

Characterization of Novel Compound

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The IR spectra were collected on a JASCO FT/IR-4100 infrared spectrophotometer by using the KBr method at room temperature. The circular dichroism spectra were recorded on a JASCO J-820 spectrometer at room temperature. The diffuse reflection spectra were measured on a JASCO V-670 UV/Vis/NIR spectrometer. X-ray fluorescence spectrometry was performed on a Shimadzu Model EDX-7000 spectrometer. Elemental analyses (C, H, N) were performed at Osaka University using a Yanaco CHN Corder MT-6. The 1H NMR spectra were recorded on a JEOL ECS400 (400 MHz) spectrometer in D2O. Sodium 4,4′-dimethyl-4-silapentane-1-sulfonate (DSS) was used as the internal standard. High-quality powder X-ray diffraction (PXRD) patterns were recorded at room temperature in transmission mode [synchrotron radiation λ = 1.0 Å; 2θ range = 2°–78°; step width = 0.01°; data collection time 1 min] on a diffractometer equipped with a MYTHEN microstrip X-ray detector (Dectris Ltd) at the SPring-8 BL02B2 beamline. The crystals in the mother liquor were loaded into a glass capillary tube (diameter = 0.3 mm), which was rotated during the measurements. The powder simulation patterns were generated from the SCXR structures using Mercury 3.10.
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7

Characterization of Nanomaterial Optical Properties

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UV-Vis-NIR extinction spectra were acquired using a Jasco V-670 UV−Vis−NIR spectrometer at 1 nm spectral resolution, in 2 mm path length quartz cuvettes. Particle size distribution (via Dynamic Light Scattering) and zeta-potential were measured at 25 °C using the Zetasizer NanoZS90 from Malvern Panalytical Ltd., Malvern, UK. Particle morphology was determined by Transmission Electron Microscopy using a JEOL model JEM1010 microscope, JEOL Ltd., Tokyo, Japan.
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8

Characterization of TAFEMgO Nanoparticles

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TAFEMgO NPs were identified and characterized by employing various chemical and spectroscopic techniques, such as UV–Visible spectrophotometer (Jasco v-670 UV-VIS-NIR spectrometer, Tokyo, Japan) from the wavelength of 200 to 850 nm, energy-dispersive X-ray diffraction (JCM-6000PLUS, New Delhi, India), FTIR spectroscopy (Thermo Nicolet Is 50- Thermo Fisher, Waltham, MA, USA) using the wave number 400–4500 cm−1, scanning electron microscopy (JCM-6000PLUS, New Delhi, India), transmission electron microscope (Jeol/JEM 2100, JEOL, Peabody, MA, USA), selective area electron diffraction, and X-ray diffraction detector (Bruker D8 Advance XRD diffractometer, Bruker, Karlsruhe, Germany) using the standardized procedure.
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