Jem 3100fef
The JEM-3100FEF is a high-resolution field emission electron microscope designed for advanced materials analysis. It is capable of delivering high-quality images and analytical data at the nanoscale level.
Lab products found in correlation
12 protocols using jem 3100fef
Ultrastructural Analysis of Femoral Nerves
Cryo-TEM Analysis of Extracellular Vesicles
Cryo-TEM Formulation Imaging Protocol
Microparticle Analysis by Advanced TEM
Cryo-TEM Imaging of Biological Samples
Exosomal Characterization via TEM Imaging
fraction was applied on a 200-mesh copper microgrid covered with a formvar support film, which had been pre-treated with soft plasma etching equipment (SEDE-AF,
Meiwafosis, Tokyo, Japan) to obtain a hydrophilic surface. The microgrid was electron-stained with 1% uranium acetate solution for 10 min and then with lead
acetate solution for 10 min. Finally, the microgrid was observed with a transmission electron microscope (JEM-1010; JEOL, Tokyo, Japan).
For cryogenic TEM (Cryo-TEM), the resuspended exosomal fraction in NaHCa buffer was applied on a 200-mesh copper microgrid that had been pre-treated with a
glow-discharger (HDT-400, JEOL) to obtain a hydrophilic surface. The microgrid was immediately plunged into liquid propane using a specimen preparation machine
(EM CPC; Leica) and then transferred to a cryo-transfer holder (Model 626-DH; Gatan, Pleasanton, CA, USA). Finally, the microgrid was observed with a
transmission electron microscope (JEM-3100FEF; JEOL) at an acceleration voltage of 300 kV in zero-loss imaging mode. The temperature of the microgrid was
maintained below –140°C during the observation.
Cryo-TEM Tilt Series Imaging Protocol
Nanomaterial Characterization by TEM and Raman
nanostructures were analyzed by TEM (JEM-2200FS, JEOL, Tokyo, Japan).
The EELS mapping and the EDS of TiO2-coated GNWs were analyzed
on a carbon-coated copper TEM grid by JEM-3100FEF (JEOL, Tokyo, Japan).
Raman spectra were recorded on an NRS-2100 spectrophotometer (JASCO,
MD, USA) using laser excitation at 514.5 nm.
Cryo-TEM Visualization of Formulation
Axoneme Ultrastructure Analysis by TEM
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