The structures of spindle knots were observed by scanning electron microscope (SEM,Quanta FEG 250, FEI) at 25 kV with gold plating. Surface elemental analysis of the GO/PDMS (GP) and RGP spindle knot was carried out by X-ray powder diffraction (XRD) on a Bruker D8 Focus X-ray diffrac-tometer using Cu K radiation (=0.1542 nm) operated at 40 kV and 40 mA. In addition, X-ray photoelectron spectroscopy (XPS) analysis was performed by an AXIS multifunctional X-ray photoelectron spectrometer (ULTRA DLD, Shimadzu Ltd., Japan at a power of 450 W to verify that GO has been reduced by chemical method. The behavior of water drop was observed via the single-lens reflex camera (Canon 80D, Japan) with time scale.
D8 focus x
Manufactured by Bruker
Sourced in Japan
The D8 Focus X is an X-ray diffractometer designed for phase identification and quantitative analysis of polycrystalline materials. It features a theta-theta goniometer and an X-ray source that delivers a focused X-ray beam to the sample for high-resolution data collection.
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4 protocols using d8 focus x
1
Structural and Chemical Analysis of Spindle Knots
2
Comprehensive Characterization of GDY HHMSs
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GDY HHMSs are characterized by a variety of techniques. XRD patterns of the products are obtained on a Bruker D8 focus X-ray diffractometer by using CuKa radiation (λ = 1.54178 Å). SEM images and EDS are obtained on a Hitachi S-4800 operated (10 kV). TEM, HRTEM, EDS, and SAED characterizations are performed with a JEOL F200 operated at 200 kV. X-ray Photoelectron Spectroscopy (XPS) experiments are performed in a ESCALab 250Xi using monochromatic Al Kα X-rays at hυ = 1486.6 eV. Peak positions are internally referenced to the C1s peak (sp2 hybrid carbon binding energy) at 284.1 eV. UV–Vis absorption spectra are recorded with a Shimadzu UV3600-Plus. The specific surface area and pore size are measured in a Micro Tristar II 3020. Raman spectra are recorded from Renishaw-inVia Qontor (wavelength: 532, 633, and 785 nm; laser power: 0.7 mW).
3
Comprehensive Characterization of GDY HHMSs
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GDY HHMSs are characterized by a variety of techniques. XRD patterns of the products are obtained on a Bruker D8 focus X-ray diffractometer by using CuKa radiation (λ = 1.54178 Å). SEM images and EDS are obtained on a Hitachi S-4800 operated (10 kV). TEM, HRTEM, EDS, and SAED characterizations are performed with a JEOL F200 operated at 200 kV. X-ray Photoelectron Spectroscopy (XPS) experiments are performed in a ESCALab 250Xi using monochromatic Al Kα X-rays at hυ = 1486.6 eV. Peak positions are internally referenced to the C1s peak (sp2 hybrid carbon binding energy) at 284.1 eV. UV–Vis absorption spectra are recorded with a Shimadzu UV3600-Plus. The specific surface area and pore size are measured in a Micro Tristar II 3020. Raman spectra are recorded from Renishaw-inVia Qontor (wavelength: 532, 633, and 785 nm; laser power: 0.7 mW).
4
Comprehensive Material Characterization Techniques
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TEM images were collected on a HITACHI HT-7700 (HITACHI, Japan) microscope operating at an accelerating voltage of 100 kV. HAADF-STEM images and EDX elemental maps were obtained on an ARM-200CF (JEOL, Tokyo, Japan) operating at 200 kV and equipped with double spherical aberration correctors. The resolution of the probe defined by the objective pre-field was 78 pm. XRD patterns were obtained on a Bruker D8 Focus X-ray diffractometer equipped with Cu Kα radiation source (λ = 1.5405 Å) operating at 40 kV. XPS data were collected on a VGESCALABMKII X-ray photoelectron spectrometer using a non-monochromatized Al-Kα X-ray source (hν = 1486.6 eV). XAFS data were obtained at the Beijing Synchrotron Radiation Facility (1W1B). Raman spectra were collected on a Renishaw inVia-Reflex spectrometer system and excited by a 532-nm laser. The metal loadings in the SACs were measured by ICP-OES (Varian 710).
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