Images of treated fabric were obtained from scanning electron microscopy (SEM) (FEI Quanta 650 FEG, Thermo Fisher Scientific, Eindhoven, The Netherlands) in secondary electron mode with a beam voltage between 15 and 20 kV. Samples were coated with 15 nm of platinum by sputter coater (Leica).
Fei quanta 650 feg
The FEI Quanta 650 FEG is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a field emission gun (FEG) electron source that provides high brightness and excellent resolution. The Quanta 650 FEG can operate in high-vacuum, low-vacuum, and ESEM (environmental SEM) modes, allowing it to accommodate a variety of sample types and sizes. It is equipped with advanced detectors for secondary electrons, backscattered electrons, and energy-dispersive X-ray (EDX) analysis.
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20 protocols using fei quanta 650 feg
Measurement of Coating Thickness and Fabric Surface
Images of treated fabric were obtained from scanning electron microscopy (SEM) (FEI Quanta 650 FEG, Thermo Fisher Scientific, Eindhoven, The Netherlands) in secondary electron mode with a beam voltage between 15 and 20 kV. Samples were coated with 15 nm of platinum by sputter coater (Leica).
Quantitative Elemental Analysis via SEM-EDS
Characterization of Ti-Zr Surfaces
SEM images of Ti50Zr-cys sample were recorded with Thermo Scientific FEI Quanta 650 FEG (Hillsboro, OR, USA) variable-pressure and environmental high-performance scanning electron microscope at 10 kV in high vacuum.
The surface wettability of the samples was recorded using Optical Contact Angle and Surface Tension Meter CAM100 (KSV Instruments, Espoo, FIN). Measurements were carried out with a Hamilton syringe, making water droplets of about 3–5 μL. Minimum three determinations were performed for each sample and presented values are the mean value. Experiments were made at room temperature and Microsoft Excel was used to calculate standard deviation.
Biofilm Characterization via SEM
SEM Imaging of Dioxidine Particles
Polymerization and Microscopy of HIPEs
Samples for environmental scanning electron microscopy (ESEM) were stored in 100 mM phosphate buffer (pH 7) and cut immediately before analysis to investigate the cross-section. ESEM micrographs were taken using an FEI Quanta 650 FEG (Thermo Fisher Scientific, Inc.) in a water-saturated atmosphere at a pressure between 704 and 823 Pa, a working distance between 6.8 mm and 8.1 mm, a 2,000-fold magnification and an acceleration voltage of 15 kV.
For scanning electron microscopy (SEM), samples were freeze-dried, cut and the cross-section coated with platinum. Analysis was carried out on a Tescan Vega 3 SBU at an acceleration voltage of 8 kV and a working distance of 14 mm.
SEM Imaging of Polymeric Samples
UV-induced Silver Nanoparticle Characterization
The size and other properties of AgNPs were characterized using a UV-Vis spectrometer (Thermo Evolution 220, Thermo Scientific, Waltham, MA, USA). Transmission electron microscopy (TEM) with a JEOL 2010 instrument (200 kV) (Tokyo, Japan) and scanning electron microscopy (SEM) with Energy-Dispersive X-ray Spectroscopy (EDS) using an FEI Quanta 650 FEG (Thermo Scientific, Waltham, MA, USA) were also employed for imaging the AgNPs. TEM imaging was used to evaluate the overall dimension of AgNPs, and SEM imaging was used to characterize the degree of aggregation of AgNPs.
Scanning Electron Microscopy of Antimicrobial Peptide Effects
Scanning Electron Microscopy Analysis
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