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Onyx detector

Manufactured by Agilent Technologies
Sourced in United States

The Onyx detector is a high-performance analytical instrument designed for laboratory applications. It provides precise and reliable detection capabilities for various analytical techniques. The core function of the Onyx detector is to accurately measure and analyze sample components within a given analytical system.

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2 protocols using onyx detector

1

X-ray Diffraction Analysis of Asymmetric Cooling Effects

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X-ray data were collected using an Agilent Xcalibur X-ray diffractometer with a Nova X-ray source and an Onyx detector (Agilent Technologies, Santa Clara, California, USA) using the following parameters: 50 kV, 0.8 mA, crystal-to-detector distance of 65.000 mm, θ (the detector angle) of 3.5°, oscillation width of 0.25°, number of frames = 2 × 6 separated by 90° and exposure time 15 s. Data were processed with CrysAlisPro in Pre-experiment mode, which outputs unit-cell parameters, an estimate of the diffraction limit and mosaicity. In CrysAlisPro, the ‘mosaicity’ is given as three components, e1, e2 and e3, which are the mosaicities in three directions defined in a coordinate system local to each reflection. e1 and e2 are the mosaicities (i.e. the angle subtended by the diffraction spots) in two orthogonal directions tangential to the Ewald sphere (on the image, e2 is the mosaicity along the direction radial from the beam center), while e3 is the mosaicity in a direction perpendicular to e1 and SS0, which is roughly the mosaicity in the scanning direction. Here, S and S0 are the scattered and incident X-ray vectors, respectively (Kabsch, 2001 ▶ ). To allow the detection of asymmetric cooling effects, we started with unit-cell parameters unconstrained by space-group symmetry.
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2

X-ray Diffraction Data Collection

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X-ray data were collected using an Agilent Xcalibur X-ray diffractometer with a Nova X-ray source and Onyx detector (Agilent Technologies, Santa Clara, California, USA) using the following parameters: 50 kV, 0.8 mA, crystal to detector distance = 65.000 mm, theta (the detector angle) = 3.5°, oscillation width = 0.25°, number of frames: 2×6, separated by 90 degrees. The detector edge was set to 1.8 Å for all crystals, regardless of their diffraction power. Exposure times were 15 or 30 seconds, the latter if the shorter exposure did not yield 2.0 Å data. Data were processed with CrysalisPro (Agilent) in Pre-experiment mode, which outputs cell parameters, an estimate of the diffraction limit and the mosaicity.
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