Ultra short cantilever probe
The Ultra-Short Cantilever probe is a specialized scanning probe microscopy (SPM) tool designed for high-resolution imaging and analysis. Its core function is to provide a sensitive and precise measurement of surface topography and properties at the nanoscale level. The ultra-short cantilever design offers enhanced stability and responsiveness, enabling accurate and reliable data acquisition.
2 protocols using ultra short cantilever probe
Atomic Force Microscopy of Photosynthetic Membranes
Atomic Force Microscopy of Thylakoid Membranes
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