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Surfacelab 7

Manufactured by ION-TOF
Sourced in Germany

SurfaceLab 7 is a software suite for the control and analysis of time-of-flight secondary ion mass spectrometry (ToF-SIMS) data. It provides a comprehensive set of tools for the acquisition, processing, and visualization of surface analysis data.

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15 protocols using surfacelab 7

1

Mass Spectrometry-Based Metabolite Profiling

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Peak
assignments were created by IonTOF SurfaceLab 7. Amino acid fragments
were assigned using an Xcalibur to create the peak lists of each cell
type. 3D OrbiSIMS spectra were exported as .txt files. Metabolites
results were searched against the Human Metabolome Database42 (link) with 5 ppm mass tolerance for putative annotation.
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2

Molecular Characterization of Skin Barrier

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Time-of-flight secondary ion mass spectrometry (ToF–SIMS) was conducted with a ToF–SIMS 5-100 instrument equipped with a 30 kV Bi liquid metal ion gun (IONTOF). Data were acquired in Bi3++ mode and calibrated against a list of reference peaks (SurfaceLab7, IONTOF). The area of analysis was 300 × 300 µm2, which was scanned over 128 × 128 pixels. The sampling depth of this technique is as low as a few nanometres—that is, only the uppermost molecular layers of the sample contribute to the analysis. Characteristic signals of cholesterol (mass to charge ratio, m/z = 369.3) and stearyl palmitate (m/z = 257.2) were selected for semiquantitative characterization of SCLs.
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3

ToF-SIMS Analysis of Brain Sections

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ToF-SIMS analysis was performed using
an TOF.SIMS 5 (IONTOF GmbH, Germany) with a 25 kV Bi3+ primary analysis beam. Dried brain sections with DAN70 matrix
were analyzed in burst alignment, delayed extraction, positive-ion
mode with a total primary ion dose of 7 × 1011 ions/cm2, cycle time 105 us, random raster mode, 1 frame/patch, 1
shot/frame/pixel, 25 scans, mass range: 1–1000 Da, mass resolution:
5000 at m/z 300, image size: 256
× 256 μm and 512 × 512 pixels, spatial resolution:
0.5 μm/pixel. Data analysis and visualization was performed
using SurfaceLab 7 (IONTOF GmbH, Germany).
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4

Lipid and Metabolite Profiling

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Peak assignments for each sample were created by IonTOF SurfaceLab 7. Peak lists of secondary mass ions and secondary intensity from the software were exported and then imported into the LIPIDMAPS database to identify the lipid species. For metabolite results, 3D OrbiSIMS spectra were exported as .txt files and then searched against the Human Metabolome Database with a 5 ppm mass tolerance for putative annotation.
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5

Mass Spectrometry Imaging Data Analysis

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TOF-SIMS data
analysis was performed using SurfaceLab 7 (IONTOF GmbH, Germany).
MALDI-MSI data were analyzed using Thermo Xcalibur 2.2 and Thermo
ImageQuest (Thermo-Fisher Scientific, USA), METASPACE (https://metaspace2020.eu), and
LipostarMSI (Molecular Horizons Srl, Italy). All images were normalized
to total ion count (TIC) and denoised by hotspot removal. Segmentation
(bisecting K-means algorithm), colocalization, and PCA analyses were
performed using LipostarMSI.
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6

High-Resolution Mass Spectrometry Imaging

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Mass spectrometry imaging was performed using a HybridSIMS instrument (ION-TOF GmbH) employing a 30 keV Bi3+ primary ion source (0.3 pA target current). In order to best accommodate sample topography, delayed extraction was used for analysis with nitrogen gas flooding. Data was acquired over a 200 × 200 µm2 area, with a resolution of 256 × 256 pixels with 20 shots per pixel. The data acquisition and analysis was performed with SurfaceLab7 (ION-TOF GmbH). Charge neutralisation was performed using a relatively low energy (< 2 eV) electron floodgun.
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7

ToF-SIMS Analysis of Surface Composition

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ToF-SIMS data were acquired using a ToF-SIMS IV instrument (ION-TOF GmbH., Münster, Germany). The primary ion beam was a bismuth liquid metal ion gun (Bi3+) run at 25 kV (pulsed target current of ~1 pA). For each sample, data were acquired over 3 regions of 500 µm × 500 µm at 256 × 256 pixels resolution for 20 scans. Data acquisition and analysis was performed using SurfaceLab 7 software (IONTOF GmbH). Selected spectra (area 1 of each sample) were normalised for comparison and identical Y scales were used.
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8

3D OrbiSIMS Imaging of AMS Samples

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3D OrbiSIMS mass spectrometry imaging was performed using a HybridSIMS instrument (ION‐TOF GmbH) employing a 30 keV Bi3+ primary ion source (0.3 pA target current) in delayed extraction mode to analyze the AMS samples. Data was acquired over a 4 × 4 mm area, with a resolution of 100 pixels per mm with 15 shots per pixel. The data acquisition and analysis was performed with SurfaceLab7 (ION‐TOF GmbH). Charge neutralization was performed using a relatively low energy (<2 eV) electron floodgun.
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9

ToF-SIMS Analysis of Protein Surfaces

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Analysis of the printed proteins before and after washing with DI water was conducted using a ToF–SIMS IV instrument (IONTOF GmbH, Münster, Germany) with a Bi3+ cluster primary ion source operated at 25 kV. The primary ion dose density was maintained at < 1 × 1012 ions/cm2 to ensure static conditions. Positive polarity spectra were acquired in high current bunched mode over 1 × 1 mm areas at a resolution of 228 pixels per mm, using the macroraster stage function. Retrospective data analysis allowed ions indicative of amino acids (e.g., CH4N+, C2H6N+, C4H8N+) to be identified. Positive spectra were mass calibrated using CH3+ (m/z 15), C2H5+ (m/z 29), C3H7+ (m/z 43), and C4H9+ (m/z 57) peaks. Data analysis was carried out using SurfaceLab 7 software (IONTOF GmbH, Münster, Germany).
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10

ToF-SIMS Analysis of Material Samples

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Material samples were cut into 1 cm2 coupons and measured by ToF–SIMS as received from manufacturer without additional processing. ToF–SIMS data were collected using a ToF–SIMS IV instrument (ION-TOF GmbH., Münster, Germany) equipped with a bismuth liquid metal ion gun and a single-stage reflectron analyser. Bi3+ primary ion energy of 25 kV and a pulsed target current of approximately 1.3 pA were used in this measurement. Low-energy electrons (20 eV) were used to compensate for surface charging due to the positively charged primary ion beam on the insulating surfaces. Rastered areas of 3 × 3 mm2 were analysed at a resolution of 100 pixels per mm and 15 frames per patch. The total primary ion beam dose for each analysed area was kept below 1 × 1012 ions per cm2, ensuring static SIMS acquisition conditions. Data acquisition and analysis were performed using IONTOF SurfaceLab7 software (IONTOF, Münster, Germany).
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