X pert pro system

The heterostructure crystal
quality, In_xAl_1–xAs stressor composition,
and epilayer relaxation and strain states were characterized using
HR-XRD. X-ray rocking curves (i.e., ω-2θ scans) and RSMs
were recorded using a PANalytical X-pert Pro system equipped with
PIXcel and proportional detectors and a monochromatic Cu Kα
(λ = 1.540597 Å) X-ray source. Analysis of the diffraction
data was performed following the methods introduced in ref (38 (link)). Independent corroboration
of the ε-Ge strain state was provided by Raman spectra collected
in the (001) backscattering geometry. All Raman spectra were captured
using a JY Horiba LabRam HR800 system equipped with a 514.32 nm Ar
laser source and calibrated using the Si LO mode at ω₀ ∼ 520 cm^–1. The surface morphology of the
as-grown ε-Ge/In_xAl_1–xAs heterostructures was investigated using a Bruker
Dimension Icon AFM in tapping mode. Finally, high-resolution cross-sectional
transmission electron microscopy was performed on a JEOL 2100 TEM
to study the structural quality, ε-Ge/In_xAl_1–xAs heterointerface
uniformity, and lattice coherence of the strained layer/stressor heterointerface.
The requisite electron transparent foils were prepared via standard
polishing techniques, that is, mechanical grinding, dimpling, and
subsequent Ar⁺ ion beam milling at low temperature (∼150
K) to prevent the redeposition of the milled material on the imaging
surface.

X-ray diffraction (XRD) measurements of thin films were obtained using a PANalytical X’Pert Pro system in the grazing incidence angle configuration. Copper Kα x-rays were generated at a tube voltage of 30 kV and a tube current of 10 mA. Scans were performed with 2θ varying from 10° to 80° with a 0.02° step and at a scan speed of 2.3° min⁻¹. The TiO₂ or ITO films were tested on p⁺-Si substrates, replicating the conditions during cell fabrication.

The phase composition of the CsPbI₃ pellet and synthesized powders were confirmed via X-ray diffraction (XRD) using a Panalytical X'Pert Pro system (Westborough, MA, USA) with a copper target (Kα = 0.15406 nm) and a step size of 0.013°. The physical density of the pellet was measured via the Archimedes technique using an Adam analytical scale (Danbury, NY, USA). The microstructures of the pellet samples were examined before and after the leaching experiments via digital photography, and scanning electron microscopy (SEM) using a FEI Versa (USA) with an energy-dispersive spectroscopy (EDS) system, conducted with an additional Oxford Instruments INCA detector (Abingdon, UK). Thermogravimetric analysis (TGA) was used to analyze the thermal stability of CsPbI₃ using a TGA-Q50 system (TA instruments, New Castle, DE). ∼20 mg of CsPbI₃ powders were weighed and placed in an alumina crucible, after which the sample was heated at a rate of 20 °C min⁻¹ in a steady flow of argon gas at 50 mL min⁻¹ until the temperature reached 1100 °C and then cooled at the same rate to 50 °C. A measurement of the Raman shift at the pellet surface was performed before and after the leaching experiment, using a Raman spectrometer with a 514 nm laser, an exposure time of 10 s, and an operating power of 20 mW.

X-ray diffraction (XRD)
studies were conducted in a PANalytical X’Pert Pro system with
copper Kα as a source (λ = 1.5406 Å) at room temperature.
The elemental composition was studied using energy-dispersive X-ray
spectroscopy (EDS) in a Jeol IT – 300. Surface morphology was
also investigated using transmission electron microscopy (TEM) in
an HR-TEM 200 kV JEM-2100 Plus. The N₂ adsorption desorption
isotherm for BET surface area analysis was obtained from a Quantachrome
Autosorb iQ. The infrared spectra of the adsorbent were analyzed in
its powder form in an Agilent, Carry 630 FTIR Spectrometer. XPS analysis
was carried out using an S-probe TM 2803, Fisons instrument with a
monochromatic Al Kα X-ray source. The fluoride ion concentration
was measured by a potentiometric method with a bench top meter, Orion
Star A124 pH/ISE, with a fluoride ion selective electrode, Thermo
Fisher Scientific, USA. The concentrations of leached metal ions in
water were analyzed using an Agilent 7800 ICP-MS.