The structure, morphology and electromagnetic parameters of the samples were measured by X-ray diffraction (XRD, Rigaku, Cu-Kα), Fourier transform infrared spectroscopy (FT-IR, BRUKER, VERTEX70), Raman spectra (HORIBA, XPLORA), X-ray photoelectron spectrometer (XPS, Thermo VG, ESCALAB250), scanning electron microscopy (SEM, JEOL, JSM-7001F), transmission electron microscopy (TEM, JEOL, JEM-2100F), energy dispersive X-ray spectroscopy (EDS) and vector network analyzer (Agilent E5071C), respectively. The specimens of electromagnetic parameters were tested by mixing samples with paraffin by the mass ratio of 1 : 1, and then pressed into toroidal shape of φout = 7.00 mm and φin = 3.04 mm with a thickness of 2.0 mm.
Escalab250
Manufactured by JEOL
The ESCALAB250 is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for surface analysis. It provides advanced capabilities for the characterization of materials at the nanoscale level.
Automatically generated - may contain errors
2 protocols using escalab250
1
Structural and Electromagnetic Characterization
2
Comprehensive Materials Characterization by XRD, SEM, TEM, XPS, and UV-Vis
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Powder X-ray diffraction (XRD) measurement
was conducted on a PANalytical, PW3040/60 diffractometer with monochromatized
Cu Kα radiation (λ = 0.15418 nm). The surface morphology
and crystal microstructure of the as-prepared samples were examined
using a field-emission SEM (FE-SEM, JEOL JSM-7001F) equipped with
an energy-dispersive spectroscopy (EDS) device and TEM (JEM2010-HR).
Surface electronic states and compositions of the sample were analyzed
by XPS (ESCALab250). The UV–vis DRS of the samples were obtained
over a UV–vis spectrophotometer (Cary 300) using BaSO4 as a reference.
was conducted on a PANalytical, PW3040/60 diffractometer with monochromatized
Cu Kα radiation (λ = 0.15418 nm). The surface morphology
and crystal microstructure of the as-prepared samples were examined
using a field-emission SEM (FE-SEM, JEOL JSM-7001F) equipped with
an energy-dispersive spectroscopy (EDS) device and TEM (JEM2010-HR).
Surface electronic states and compositions of the sample were analyzed
by XPS (ESCALab250). The UV–vis DRS of the samples were obtained
over a UV–vis spectrophotometer (Cary 300) using BaSO4 as a reference.
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