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Ac160ts

Manufactured by Olympus
Sourced in Germany, Japan

The AC160TS is a laboratory equipment product from Olympus. It is designed for conducting various analytical and research tasks in controlled environments. The device's core function is to provide precise temperature and humidity control for sample preparation and analysis.

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17 protocols using ac160ts

1

Characterization of Novel Organic Compounds

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All the chemicals were commercially available from Tokyo Kasei Chemicals Co. 1H- and 13C{1H}-NMR spectra were acquired on a Bruker AV-400M (400 MHz) and a JEOL JNM-500 (500 MHz). The chemical shifts were referenced with respect to CHCl3 (δ 7.26), HDO (δ 4.79) for 1H, and CDCl3 (δ 77.0), DSS (sodium 3-(trimethylsilyl)-1-propanesulfonate) (δ 0.0) for 13C as internal standards. High resolution electrospray ionization mass spectrometry (HR-ESI-MS) was recorded on a Bruker micrOTOF II. The TEM was performed at 100 kV using Hitachi H-7650 Zero with collodion/carbon-support film grids, COL-C15 STEM Cu150P (Okenshoji, Japan). The AFM was performed using Oxford Instruments Cypher S using OLYMPUS AC160TS.
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2

Atomic Force Microscopy of EncA and EncAC Proteins

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EncA and EncAC proteins (both free and incubated with pUC19 at a stoichiometry of 1:1 (1.5 nM) at room temperature for 30 min in 50 mM MOPS buffer, pH 7.0 and 50 mM NaCl containing 5 mM NiCl2) were used for atomic force microscopy (AFM) imaging. The samples were deposited onto a fresh cleaved grade V1 muscovite mica (Ted Pella, Inc., Redding, CA, USA), incubated for 10 min, washed with deionized water, and dried with a weak stream of nitrogen gas. AFM images were collected in air at room temperature and atmospheric pressure, using an Asylum Research MFP-3D standalone (Oxford Instruments, High Wycombe, UK) operated in alternate contact mode with commercial silicon cantilevers (Olympus AC160TS, f0 = 300 kHz; k = 26 N/m, Olympus Corporation, Tokyo, Japan). Images were processed using the Gwyddion modular program (Czech Metrology Institute, Brno, Czech Republic).
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3

Characterization of Microfluidic Chip

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SEM of the microfluidic chip was performed in a Hitachi™ 3030Plus tabletop workstation (Hitachi High-Tech Europe GmbH, Krefeld, Germany). Atomic force microscopy (AFM) analysis was performed in an Asylum Research MFP-3D Standalone AFM system (Oxford Instruments). AFM measurements were performed in AC mode in air. Silicon AFM probes (Olympus AC160TS, Olympus Corporation, Japan; k = 26 N m−1, f0 = 300 kHz) were used for AFM measurements. Static water contact angle measurements were performed with DataPhysics OCA 15 Plus, using 2 μL droplets of deionised water. The side view of the droplet was acquired by the system.
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4

Characterizing Surface Morphology of Coatings via AFM

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AFM measurements were used for analysing the surface morphology and the overall roughness (quantified by the root mean square, RMS) of the obtained coatings. Imaging was performed on a commercial AFM (XE 100: Park Systems, Suwon, South Korea) in non-contact mode using silicon tips (AC160TS: Olympus Europa, Hamburg, Germany) in ambient air and in liquid at room temperature. The in-liquid imaging was performed in a pH 6.4 solution, returning to the same sample position as the ambient air scan, wherever possible. The change in pH was produced by adding HCl or 0.01 M NaOH to Na2HPO4 water solution.
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5

DNA-compound 4 complex analysis by AFM

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In a similar manner as described in [16 (link)], the samples were prepared by diluting a DNA stock solution (6 mM) in sodium cacodylate buffer (I = 0.05 M, pH 5.0) with water and for compound 4 (4 mM stock solution) at various molar ratios of compound 4 to DNA. For each measurement, 10 μL of the mixed solution were deposited onto a freshly cleaned mica surface (Plano GmbH). The sample was dried by means of a spin-coater (1 min at 20 rps and 2 min at 100 rps). For the AFM imaging operating in the tapping mode (scan rate 5 μm s−1) with N-type silicon cantilevers (AC-160TS, Olympus) a NanoDrive controller with an Innova scanning probe microscope (Veeco, Germany, Mannheim) was used. The analysis of the AFM images was carried out by use of the Gwyddion (version 2.19) software.
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6

Characterizing Surface Morphology of Stimuli-Responsive Coatings

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The surface morphology and the overall roughness (quantified by the root mean square roughness) of the p(NIPAM-BA) layers were analyzed by AFM (XE 100, Park Systems, Suwon, South Korea). Imaging was performed in non-contact mode, using silicon tips in ambient conditions. In the case of measuring the hydration of the coatings, imaging was performed in ambient conditions in air and in liquid (aqueous solution) in non-contact mode, using the same AFM tip (AC160TS: Olympus Europa, Hamburg, Germany) and without changing the lateral position of the sample. The roughness values were measured in different areas of the samples and for at least three samples; the values were mediated.
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7

Atomic Force Microscopy of Protein Samples

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Samples were diluted to a concentration of 0.18 mg/ml in a buffer containing 25 mM HEPES, pH 7.5, 100 mM NaCl and 1 mM DTT. Diluted samples (∼7 μl) were deposited on freshly cleaved mica chips mounted to microscope slides. Samples were incubated for 5 min at room temperature. After incubation, slides were dipped in distilled water and allowed to air-dry overnight. Atomic force microscopy was performed with an Asylum Research MFP-3D-BIO (Asylum Research, an Oxford Instruments company; Santa Barbara, CA, USA). Images were acquired in AC mode in air, using a 160 μm rectangular silicon probe with an aluminum reflex coating, tip radius of 9 ± 2 nm and a spring constant of 42 N/m (Olympus, AC160TS). Instrument settings were as follows: set point ∼600 mV, integral gain 4.5, drive amplitude 153 mV, drive frequency 73 KHz at a 90° scan angle, scan rate of 1 Hz, 512 lines per image and constant image gains. Topographical dimensions of sample features were analyzed off-line using Igor Pro 6.34 software (WaveMetrics, Portland, OR, USA).
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8

Nanoscale Characterization of mimLUB

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Atomic force microscopy measurements were performed in air using a commercial AFM (MFP-3D, Asylum, Sta. Barbara, CA, USA) to assess the nanostructure of mimLUB adsorbed onto mica. Conical SiO2 probes with nominal radius of curvature of 9 nm mounted on compliant (k = 42 N/m) levers (AC160TS, Olympus, USA) or triangular pyramid Si tips with k = 93 N/m lever and 10 nm radius of curvature from Appnano (model ACCESS-NC-A) were used for AC mode imaging. Images were taken over a range of 2 µm × 2 µm, at a frequency of 1 Hz and 1,536 × 1,536 pixels for maximal resolution. Image analysis was performed in Gwyddion (Czech Metrology Institute) and ImageJ (NIH). AFM samples consisted of freshly cleaved mica substrates, (i) spin-coated at 2,000 rpm for 1 min with 100 µl of a dilute mimLUB solution in DI water (0.3 mg/ml) and left 1 h for complete drying, or (ii) incubated for 30 min, rinsed with DI water, and left 1 h for complete drying.
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9

AFM Characterization of DNA Nanostructures

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The morphology-based characterization was performed using Atomic Force Microscopy. A freshly cleaved mica was treated with 1 mM NiCl2 solution for 15 minutes and then washed 2 times with ultrapure water. 20 -30 µl droplets DNA nanostructure samples (150nM) were then overlayed on top and was incubated for 15 minutes. The excess sample was then drained and washed 2 times with ultrapure water and was dried and imaged using MPF-3D BIO AFM (Asylum Research, Oxford Instruments) in tapping mode in air. A sharp silicon cantilever AC160TS (Olympus) was used for AFM imaging. HeLa (Cervical Cancer), MDA-MB-231 (Breast Cancer), Rpe1 (Retinal pigment epithelial cells), HEK293T (Human Embryonic Kidney cells), KB3 (Oral Cancer) cells were maintained in DMEM, SUM-159-A (Breast Cancer) cells were maintained in HAMS-F12 media and SHSY5Y (Human Neuroblastoma) were maintained in DMEM-F12. All the media were supplemented with 10% foetal bovine serum and 1% penicillium/streptomycin. The cells were maintained at 37°C with 5% CO2 in a humidified incubator.
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10

Atomic Force Microscopy Imaging of Nanoparticles

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Atomic force microscopy (AFM)
images were acquired in the AC mode on a Cypher S system (Asylum Research).
The probes used were AC160TS from Olympus probes with a nominal resonant
frequency of 300 kHz and a spring constant of approximately 40 N m–1 on a multimode AFM (Asylum Research). Images were
acquired at a pixel resolution of 512 and a scan rate of 1 Hz. Samples
were diluted to 1 mg mL–1 in water, and samples
were prepared by drop casting the solution onto a freshly cleaved
mica substrate and drying under stream of nitrogen. The data were
analyzed with Gwyddion software.
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