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Mfp 3d sa afm

Manufactured by Oxford Instruments
Sourced in United States

The MFP 3D-SA AFM is a scanning probe microscope that uses an atomic force microscope (AFM) to measure surface topography and properties at the nanoscale. It provides high-resolution imaging and analysis capabilities for a wide range of sample types.

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3 protocols using mfp 3d sa afm

1

Collagen Gels with Royal Jelly Exosomes

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Collagen gels at a concentration of 2 mg/ml (favorable concentration determined in
microvesicle release experiments) were prepared on ice, with and without RJ exosomes
(2.5 × 109/ml). Fifty microliter gels in a 96 well plate were left to
polymerize for 30 min at 37 °C. Gels were then covered with PBS for 5 h and mildly fixed
by immersion in paraformaldehyde 4% (Sigma, US) for 30 mins. Samples were immediately
washed twice with distilled water and kept at 4 °C until atomic force microscopy (AFM)
experiments (within 24 h). For AFM imaging, gels were physiosorbed onto a clean glass
cover slips and immediately placed under a MFP 3D-SA AFM (Asylum Research, US). Images of
5 × 5 µm and 2 × 2 µm were obtained for both conditions in AC mode, employing TAP300GD-G
cantilevers (k ∼ 40 N/m, ∼300 kHz, BudgetSensors, Bulgaria).
Height and amplitude channel data was recorded and processed with proprietary Asylum
Research AFM software (v16.10.211).
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2

Multiscale Structural Characterization of Heterostructures

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Transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM) images were obtained using a JEM-2001F (JEOL, 200 kV primary beam) equipped with a Gatan CCD camera. The morphology of the samples was observed by using S-4800 (Hitachi, accelerating voltage of 25 KV) cold field emission scanning electron microscope (FESEM). The crystal structure of heterostructure was analyzed by D8 Advance X-ray diffraction systems (Bruker, λ = 0.154056 nm). Raman spectra of the samples were tested by an InVia (Renishaw, UK) spectrometer to reflect the composition equipped by a 633 nm laser. The thickness of all samples was also analyzed by MFP-3D-SA AFM (AsylumResearch, USA) using a tapping mode at a scan rate of 1 Hz.
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3

Atomic Force Microscopy of Mica Surfaces

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An MFP-3D SA (AFM) instrument (Asylum Research, Santa Barbara, CA) was used to image the structure on the mica surfaces in intermittent contact (AC mode) under conductivity water. The AFM probe (SNL, Bruker) has a silicon tip with a nominal radius of 2 nm and a triangular silicon nitride cantilever having a nominal spring constant of 0.35 N/m).
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