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Uv vis 2600

Manufactured by Shimadzu
Sourced in Japan

The Shimadzu UV-Vis 2600 is a double-beam spectrophotometer designed for accurate and reliable UV-Vis analysis. It features a wavelength range of 185 to 1,300 nm and can be used to measure the absorbance, transmittance, or reflectance of a wide range of samples.

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4 protocols using uv vis 2600

1

Quantitative Analysis of Wine Aroma

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By calculating the ratio of the volatile compound concentration to its odor perception threshold, the odor activity value (OAV) was obtained. This analysis was used to assess the potential contribution of individual volatile compounds to wine aroma.
Chromatic parameters were measured in triplicate using a spectrophotometer Shimadzu UV-Vis 2600 (Shimadzu, Kyoto, Japan) [30 (link)] and analyzed via CIELab system to detect the lightness (L*), reddish attribute (a*), and yellowish attribute (b*) of each wine [32 ]. The visual change in wine, described as ΔE, was calculated using the following equation [28 ]:

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2

Characterization of Silver Nanoparticles in Coatings

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X-ray diffraction (XRD) measurements were conducted on a X'Pert3 diffractometer (Malvern Panalytical). The infrared spectra of urushiol and PUL/AgNPs were measured using fourier transform infrared spectroscopy (FTIR, Nicolet 5700). Absorption spectra for AgNPs were obtained using the UV-visible spectrophotometer (UV-vis-2600, Shimadzu Corporation). Scanning electron microscope (SEM, JSM-7500F) with an accelerating voltage of 5 kV was used to characterize cross-section morphologies of the different prepared coatings. The presence of silver element signal was characterized by EDX spectroscopy. Transmission electron microscopy (TEM, JEM-2100) was also used to characterize the morphologies of AgNPs and PUL/AgNPs. SEM (Sigma HD) equipped with an EDX spectroscopy to detect the presence and distribution of AgNPs in the coating. The Ag+ concentration was determined by inductive coupled plasma emission (ICP, Optima 8000).
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3

Comprehensive Characterization of Heterostructured Films

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Various characterization techniques were employed for investigation of the material properties. The Raman measurements were used individually by continuous laser beam of Raman (λ = 750 nm, HORIBA micro-Raman, Lab Ram ARAMIS) to characterize ultra-thin films. To investigate the memristive behavior of heterostructured films, Raman measurements were individually performed at the zero bias and then at the HRS mode of memristor device. XPS studies were extensively used to evaluate the chemical compositions, percentage of elements, and vacancies in the RTA and heterostructured films as well as to determine the band alignment at semiconductor heterointerfaces (XPS, Thermo Scientific theta probe). The absorbance and reflectance spectra of samples were measured using UV–visible diffused reflectance spectrometer (Shimadzu, UV–Vis 2600) to evaluate the bandgap of heterostructured films. To this aim, all films were deposited on the highly transparent glass substrates. The field emission scanning electron microscope (FESEM JEOL-7800F) was used for measurement of photoluminescence characteristics. Hall-effect measurements (Ecopia) were employed to measure the conductivity of the samples. Kelvin probe force microscopy was used to measure the surface potential of samples.
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4

Characterization of Mn-Citrate Nanoparticles

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Images of HRTEM and transmission electron microscope (TEM) were obtained using a FEI TecnaiTF-20 field emission HRTEM operating at 200 kV. For the preparation of TEM sample, the nanocomplex solution was drop-casted on a 300-mesh amorphous carbon-coated copper grid and kept overnight at ambient temperature. The X-ray diffraction (XRD) patterns of the samples were obtained using a Panalytical XPERT PRO diffractometer equipped with Cu Kα radiation (at 40 mA and 40 kV) by using a scanning rate of 0.021 S−1 in the range from 201 to 801. Using Shimadzu UV-Vis 2600 spectrometer absorbance spectra of Mn-citrate NCs were measured. Fluorescence excitation and emission spectra of the prepared nanoparticle was accessed using Fluorolog, Model LFI-3751 (Horiba-JobinYvon, Edison, NJ) spectrofluorimeter. We followed the methodologies for picosecond resolved spectroscopic analysis reported in our previous studies.
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