The largest database of trusted experimental protocols

Tecnai g2 f20 s twin field emission tem

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Tecnai G2 F20 S-TWIN field emission TEM is a transmission electron microscope designed for high-resolution imaging and analysis. It features a field emission gun, which provides high-brightness and high-coherence electron beam, enabling the instrument to achieve sub-Ångström resolution. The S-TWIN objective lens configuration allows for enhanced contrast and resolution. The Tecnai G2 F20 S-TWIN is capable of performing various analytical techniques such as electron diffraction, elemental mapping, and spectroscopy.

Automatically generated - may contain errors

2 protocols using tecnai g2 f20 s twin field emission tem

1

Characterization of Ni3Si2O5(OH)4-g-P4VP Nanotubes

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphologies of the resultant Ni3Si2O5(OH)4-g-P4VP NTs were observed
under a Tecnai G2 F20 S-TWIN field emission TEM (FEI, USA) equipped
with an energy dispersive X-ray (JEOL, Japan). The FTIR spectra were
recorded in a Frontier FTIR spectrometer (PerkinElmer, USA) with KBr
disks in the wave number range of 600–4000 cm–1. The XPS measurements were conducted on a Kratos AXIS Ultra DLD
spectrometer (Kratos Analytical, UK) under monochromatized Al Kα
X-ray radiation (1486.6 eV). The organic loading in Ni3Si2O5(OH)4-g-P4VP
NTs was measured by thermogravimetric analysis (TGA) performed with
a TGA/DSC2 thermogravimetric analyzer (Mettler Toledo, Switzerland)
at a heating rate of 20 °C/min from 30 to 700 °C under nitrogen
atmosphere. The paramagnetic properties of the magnetic particles
were verified by the magnetization curve measured by vibrating sample
magnetometry. The content of chromium was determined by an atomic
absorption spectrophotometer(Varian AA 320, Varian Inc. Palo Alto,
CA).
+ Open protocol
+ Expand
2

Synthesis and Characterization of ZnO Thin Films

Check if the same lab product or an alternative is used in the 5 most similar protocols
A BENEQ TFS-200 ALD system was used to deposit the ZnO seed layers. The thicknesses of the ZnO films deposited on flat silicon substrates were measured by a SOPRA GES-5E spectroscopic ellipsometry (SE) system. The morphologies of all the samples were recorded on a Zeiss SIGAMA HD field-emission SEM and an FEI Tecnai G2 F20 S-TWIN field-emission TEM. Wide-angle XRD patterns were collected on a Bruker D8 Advance powder X-ray diffractometer with Ni-filtered Cu-Kɑ1 radiation (40 kV, 40 mA, 1.5406 Å). XPS measurements were conducted on a PHI 5000 VersaProbe system using an Mg-Kα X-ray source.
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!