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Holey carbon film

Manufactured by Agar Scientific

Holey carbon film is a thin, perforated carbon membrane that is commonly used as a support substrate for samples in transmission electron microscopy (TEM) imaging. The film contains a regular array of small holes that allow the electron beam to pass through the sample and produce high-contrast images.

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2 protocols using holey carbon film

1

Particle Size and Titanium Content Analysis

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The particle size of all solutions was measured by dynamic light scattering (ZetaSizer ZSP, Malvern Instruments) at 25 °C using the measurement position of 4.65 mm with automatic attenuation and the “general purpose” mode, 12 runs of 10 seconds each were performed. All mean particle sizes were taken from the intensity results. The amount of soluble Ti(iv) was measured by a colorimetric method with Tiron (4,5-dihydroxy-1,3-benzenedisulfonic acid) 5.0 mM in acetate buffer pH 4.5.32 (link) The relative content of Ti(iv) was obtained by comparing with the content of soluble Ti(iv) obtained in the solution of TiBALDH in water only. The crystallinity and morphology of TiO2 were observed by transmission electron microscopy (TEM) using a JEOL 2010 instrument operated at 200 kV. Two microliters of the sample were deposited in a copper grid covered with a holey carbon film (300 mesh, Agar Scientific), and dried at room temperature.
Note: all prepared solutions of TiBALDH (TiBALDH-water, TiBALDH-ions, TiBALDH-TiBALDH-PB, TiBALDH-Tiron, TiBALDH-pH) were capped and incubated at least for 24 h at room temperature and made by triplicate.
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2

Characterization of CNT-Metal Oxide Composites

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Both transmission electron microscopy (TEM) and scanning electron microscopy (SEM) were used to analyse the morphology of the CNT-metal oxide composite material. For TEM, the samples were prepared in dry conditions by spreading the samples as a powder onto 400 mesh copper grids with a holey carbon film (Agar Scientific). High-resolution TEM (HRTEM) images were obtained using a Tecnai F20 system at 200 kV with a high brightness field emission gun (FEG). SEM samples were prepared on single crystal silicon substrates. Particles were either deposited with a thermophoretic sampler or by spreading filter-collected dry powder over the substrate, applying a drop of ethanol and air drying. SEM images were obtained using a Leo Variable pressure SEM with an accelerating voltage of 2.49 kV and a working distance of approximately 5 mm.
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