The morphologies
of the Cu powder samples and of the top surface of the cured ICA samples
(filler dispersion and microstructure) were characterized using a
Zeiss 1530VP field emission gun scanning electron microscope (FEG-SEM).
Elemental mapping was also conducted within the FEG-SEM using energy-dispersive
X-ray spectroscopy (EDS). Samples of Cu powder and ICAs printed on
glass were attached to carbon adhesive tape mounted on SEM stubs and
coated with a thin layer of gold/palladium (Au/Pd) alloy (80/20) using
a Quorum Q150R S sputter coater. The Au/Pd coating applied was sufficiently
thin to not be recognized in the images. The cross-sectional microstructures
of the ICAs were prepared and characterized using a focused ion beam
(FIB-SEM) system (FEI Nanolab 600 Dual Beam). A platinum (Pt) layer
(∼2 μm thick) was deposited on the surface of the sample
prior to FIB milling to preserve the outermost surface.
A standard
lift-out procedure using FIB-SEM was followed to prepare the lamella
for TEM to achieve a thickness of ∼200 nm. The nanostructure
of the ICA sample sections was then studied using an FEI Tecnai F20
scanning transmission electron microscope (STEM) equipped with Oxford
Instruments energy-dispersive X-ray spectroscopy (EDS) with a windowless
detector (X-MaxN 80 TLE).
of the Cu powder samples and of the top surface of the cured ICA samples
(filler dispersion and microstructure) were characterized using a
Zeiss 1530VP field emission gun scanning electron microscope (FEG-SEM).
Elemental mapping was also conducted within the FEG-SEM using energy-dispersive
X-ray spectroscopy (EDS). Samples of Cu powder and ICAs printed on
glass were attached to carbon adhesive tape mounted on SEM stubs and
coated with a thin layer of gold/palladium (Au/Pd) alloy (80/20) using
a Quorum Q150R S sputter coater. The Au/Pd coating applied was sufficiently
thin to not be recognized in the images. The cross-sectional microstructures
of the ICAs were prepared and characterized using a focused ion beam
(FIB-SEM) system (FEI Nanolab 600 Dual Beam). A platinum (Pt) layer
(∼2 μm thick) was deposited on the surface of the sample
prior to FIB milling to preserve the outermost surface.
A standard
lift-out procedure using FIB-SEM was followed to prepare the lamella
for TEM to achieve a thickness of ∼200 nm. The nanostructure
of the ICA sample sections was then studied using an FEI Tecnai F20
scanning transmission electron microscope (STEM) equipped with Oxford
Instruments energy-dispersive X-ray spectroscopy (EDS) with a windowless
detector (X-MaxN 80 TLE).