A scanning electron microscope (SEM) (Model: JEOL-JSM-IT 200, Manufactured by Jeol Ltd, Tokyo, Japan) was employed to study the microstructure of the developed AMMCs. To carry out microstructural analysis (as per ASTM D3039 standards), specimens of the developed AMMCs were polished using emery sheets and etched using Keller’s etchant. The hardness test was performed on the developed composite specimens as per the ASTM E10 standard; this test method covers the determination of the Brinell hardness of metallic materials by the Brinell indentation hardness principle. Also, this standard provides the requirements like load and size of the indenter for a Brinell testing machine (Model: HR-530, Manufactured by Mitutoyo Corporation, Kanagawa, Japan), and the procedures for performing Brinell hardness tests. [25 (link)]. A Brinell hardness tester with 500 kg load and 10 mm hardened steel ball indenter was utilised to conduct the hardness test.
Jsm it200
Manufactured by JEOL
Sourced in Japan, United States, China, Germany
The JSM-IT200 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of samples. It features a tungsten (W) thermal field emission (TFE) electron source and provides a maximum accelerating voltage of 30 kV. The microscope is capable of achieving a resolution of 3.0 nm at 30 kV.
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Lab products found in correlation
Jem 2100 plus, by JEOL (4 mentions)
Escalab 250xi, by Thermo Fisher Scientific (4 mentions)
Dii 29010sctr smart coater, by JEOL (3 mentions)
Sc7620, by Quorum Technologies (3 mentions)
Spectrum 2b, by PerkinElmer (2 mentions)
X pert pro, by Malvern Panalytical (2 mentions)
Jem 2100f, by JEOL (2 mentions)
E 1030, by Hitachi (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Streptomycin, by Thermo Fisher Scientific (2 mentions)
Jem 2010f, by JEOL (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
C9920 02, by Hamamatsu Photonics (1 mentions)
Jsm 5500lv, by JEOL (1 mentions)
C0250, by Merck Group (1 mentions)
Sc7620 mini sputter coater, by Quorum Technologies (1 mentions)
G5882, by Merck Group (1 mentions)
Scd 050, by JEOL (1 mentions)
Dii 29030sctr, by JEOL (1 mentions)
Amx 500 nmr spectrometer, by Bruker (1 mentions)
109 protocols using jsm it200
1
Microstructure and Hardness Analysis of AMMCs
2
Comprehensive Structural and Optical Analysis of ZnO Structures
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The surface morphology of the ZnO stuctures was analyzed using an Auriga Crossbeam 540 SEM (Carl Zeiss, Germany) and detailed structural characterization was performed using a TEM (JEM2010F, JEOL Ltd, Japan). Energy-dispersive X-ray spectroscopy (EDX) analysis has been conducted using SEM (JEOL JSM-IT200, JEOL Ltd, Japan). The crystallographic structure and phase purity of the ZnO stuctures were determined using a SmartLab X-ray Diffractometer (Rigaku Corp., Japan) with a Cu Kα radiation source. The surface area and pore size distribution were analyzed by Autosorb iQ nitrogen porosimeter (Quantachrome Instruments, USA). The absorbance of the ZnO stuctures was tested using an absolute quantum yield spectrometer (C9920-02, Hamamatsu Photonics, Japan) equipped with an integrating sphere.
3
Morphological Analysis of CNP Samples
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The size, construction, and morphology of the CNP samples were examined. After coating by a gold sputter coater (SPI-Module), samples were examined by SEM (model JEOL-JSM-IT200) at 20 kV at the Electron Microscope Unit, Faculty of Science, Alexandria University, Alexandria, Egypt.
4
Bacterial Nanocellulose Morphology and Structure
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The size, morphology, and structure of the bacterial nanocellulose samples produced by Bacillus sp. strain SEE-3 coated with gold using a sputter coater (SPI-Module) and were analysed by a scanning electron microscope (SEM) “JSM-5500 LV; JEOL, Ltd- Japan; by using high vaccum mode operating at 15 kV at the Regional Center of Mycology and Biotechnology, Al-Azhar University, Cairo, Egypt”. The samples were also examined with SEM “model JEOL-JSM-IT200; at 20 kV at the Electron Microscope Unit, Faculty of science, Alexandria University, Alexandria, Egypt”. The samples were examined with a Transmission Electron Microscope (TEM) “JEM-2100 Plus, JEOL Ltd., Japan; at the Central Laboratory, City of Scientific Research and Technological Applications, Alexandria, Egypt”.
5
Electron Microscopy Sample Preparation
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Samples were fixed in 2% formaldehyde, 2.5% glutaraldehyde (Sigma Aldrich, G5882) in 0.1 M cacodylate (Sigma Aldrich, C0250) for 24 h. Samples were rinsed with 0.1 M cacodylate, dehydrated in a graded ethanol series, and dried in hexamethyldisilazane (Sigma Aldrich, 440191). Samples were sputter-coated with a thin gold layer (SC7620 Mini Sputter Coater, Quorum Technologies) prior to observation on a scanning electron microscope (JSM-IT200, JEOL).
6
SEM Sample Preparation: Gold Coating
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For scanning electron microscopy (SEM), samples were coated by gold (2 nm thin layer) in an ion sputter coater (Bal-Tec SCD 050) and observed with a JEOL JSM-IT 200 microscope.
7
Scanning Electron Microscopy of Optimized Biopolymer Gel
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After lyophilization in a lyophilizer from ThermoFisher (model ModulyOD R23T-659559-RT, Pittsburgh PA, U.S.A.), the morphology of the biopolysaccharide matrix of the optimized gel formulation was observed in a scanning electron microscope (SEM) from JEOL (model JSM-IT200, Tokyo, Japan) working at high-vacuum, equipped with an Energy Dispersive X-ray Spectrometer (EDS) detector also from JEOL (model DRY SD™25 Detector Unit, Tokyo, Japan). Samples of the lyophilized gel were sputter-coated with a Au film (92 Å thickness) via cathodic pulverization on a carbon layer produced by evaporation in a metalizing device also from JEOL (Sputter Coater model DII-29010SCTR Smart Coater, Tokyo, Japan). Photomicrographs were gathered using electron beams with acceleration speeds of 10.0 keV via random scanning.
8
Scanning Electron Microscopy Analysis of EBMW Particles
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The surface and morphology of an EBMW particle were analyzed in a SEM (JEOL, model JSM-IT200, Tokyo, Japan) at high-vacuum. The samples were sputter-coated with a 92 Å-thick Au film via cathodic pulverization, in a metalizing device (JEOL, Sputter Coater model DII-29010SCTR Smart Coater, Tokyo, Japan). Photomicrographs were collected via random scanning using electron beams at acceleration speeds of 10.0 keV.
9
Characterizing Composite Interface by SEM
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The interface between the BC fiber and iPP of the composites was characterized by a scanning electron microscope (JSM-IT200, JEOL, Tokyo, Japan) at an accelerated voltage of 2 kV.
10
Scanning Electron Microscopy Analysis of Ulvan
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In order to gain insight into the morphology and surface texture, the partially purified ulvan from U. lactuca was studied using high-resolution scanning electron microscopy (HRSEM; JSM-IT 200, Jeol, Japan) under high vacuum, acceleration voltage of 15 kV, and large field detector. The sample for SEM analysis was prepared by coating with gold (15°A) for 2 min by physical vapor deposition [24 (link), 28 (link)]. Additionally, the quantitative elemental composition of the polysaccharide was analyzed using a scanning electron microscope–energy dispersive X-ray (SEM–EDX) spectrometer. No pretreatment was performed for the EDX measurement. The weight and atomic percentages of the different elements in the sample were related to the emitted X-rays [32 (link)].
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