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Super x eds detector

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Super-X EDS detector is a highly sensitive and efficient energy-dispersive X-ray spectroscopy (EDS) detector designed for use in scanning electron microscopes (SEMs) and other electron beam instruments. It features a large active area and advanced electronics to provide high-resolution elemental analysis capabilities.

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7 protocols using super x eds detector

1

Characterization of Calcium Phosphate Precipitation

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For further characterization of the early stages
of calcium phosphate
precipitation in the presence and absence of citrate, samples were
collected from the reaction media at different reaction times, quenched
in ethanol, transferred onto carbon-coated copper grids, and observed
using a 30 μm objective aperture in a FEI TEM Titan working
at 300 kV. SAED patterns were collected using a 10 μm aperture,
which allowed the collection of diffraction data from a circular area
∼0.2 μm in diameter. Elemental compositional maps were
obtained in the STEM mode using a Super X EDS detector (FEI), formed
by four SSD detectors with no window surrounding the sample. STEM
images in the FEI Titan TEM of the areas analyzed by EDS were collected
with a high-angle annular dark field detector. At the end of each
titration experiment, the solution was separated from the reaction
media by filtration (Nucleopore, Ø = 200 nm),
and the solids collected were studied by X-ray diffraction (PANalytical
X’Pert Pro X-ray, Cu Kα radiation, λ = 1.5405 A°,
3°–50° 2θ range, scanning rate of 0.11°
2θ s–1), FTIR (ATRproONE-FTIR, Jasco Model
6600, frequency range of 400–4000 cm–1, resolution
of 2 cm–1, and 100 accumulations), FESEM (Zeiss
SUPRA40VP), and TEM (FEI Titan, 300 kV).
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2

Characterization of Hierarchical Porous Detonation-Assisted Material

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The morphology and structure of HPDA were investigated by transmission electron microscopy (TEM, Talos F200s, FEI, USA). Elemental information of HPDA was characterized by energy-dispersive X-ray spectroscopy (EDX, Super-X EDS Detector, FEI, USA). In addition, the surface area and pore size distribution of HPDA were determined by a Brunauere Emmette Teller (BET, ASAP 2460 3.01, Micromeritics, USA) and the specific surface area (SBET) and mean pore diameter were calculated by using the BET theory [56 (link)]. Total pore volume was calculated based on liquid nitrogen adsorbed at P/P0 = 0.99. The Barrett–Joyner–Halenda (BJH) theory was used to determine the pore size distribution from the nitrogen adsorption values.
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3

Comprehensive Characterization of Photocatalysts

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To clarify various properties of prepared materials, photocatalysts were characterized with the use of numerous pieces of advanced equipment. The morphologies of materials were observed using an FEI Talos F200s (USA) transmission electron microscope, equipped with high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and an FEI Super-X EDS detector (USA). The mineral composition of the synthesized material was measured by XRD patterns using a Shimadzu XD-3A diffractometer (Japan), employing the radiation of Cu-Kα (λ = 1.54056 Å). In addition, the surface chemical compositions of the catalysts were examined with a PHI 5000 VersaProbe X-ray photoelectron spectrometer (USA). The optical properties of the photocatalysts were detected by UV-Vis spectroscopy using a PerkinElmer Ultraviolet spectrophotometer (Shanghai, China). Additionally, the active species in the photocatalytic system were analyzed by electron spin resonance using an electron paramagnetic resonance spectrometer (EMXmicro-6/1/P/L, Karlsruhe, Germany), and the DMPO (5,5-dimethyl-1-pyrroline N-oxide) was selected as the capturing agent to trap the free radicals of O2 and OH. Electrochemical impedance spectroscopy was conducted and photocurrent were measured with a CHI 660E electrochemical workstation (Shanghai, China).
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4

Characterizing Aluminum Impurity Deposits

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A Sigma 300 VP
(Zeiss, Germany) scanning electron microscope equipped with an Oxford
SDD 30 EDS detector (Oxford Instruments, United Kingdom) was used.
Transmission electron microscopy (TEM) lamellae were prepared by an
FEI Nova 200 NanoLab (FEI, USA), a dual beam focused ion beam (FIB)/SEM
microscope, and mounted at an Omniprobe Cu grid. Measurements were
performed with an FEI Titan3 (link) G2 60-300
(FEI, USA) equipped with a CS-probe corrector, a Super-X EDS detector
(FEI, NL), and a Gatan Image Filter Quantum ERS (Gatan, USA) as well
as a K2 direct electron detection camera (Gatan, USA). All TEM measurements
were carried out at 300 kV acceleration voltage and in monochromated
STEM mode. Elemental maps and line scans were obtained using GMS 3
(Gatan, USA). The HAADF SE image of the impurity deposit and corresponding
TEM-EDS maps (Figure S6b–h) were
acquired and processed using Velox Version 2 (Thermo Fischer Scientific,
USA). As for SNMS and XPS, it was necessary also for TEM to use thin
film samples because the surface of mechanically polished Al is too
rough.
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5

STEM-EDS Analysis of Nanomaterials

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HAADF and EDS images were obtained using the STEM, Titan-G2 manufactured by FEI. Specimens for the STEM were fabricated by a focused ion beam using Versa 3D manufactured by FEI. STEM-EDS maps were obtained using Super-X EDS detector manufactured by FEI and the Bruker Esprit version 1.9 software (https://www.bruker.com/products/x-ray-diffraction-and-elemental-analysis/eds-wds-ebsd-sem-micro-xrf-and-sem-micro-ct/esprit-2.html).
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6

Transmission Electron Microscopy Sample Preparation

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Specimen preparation for transmission electron microcopy (TEM) was carried out using a ThermoFisher Talos F200X at the Electron Microscopy center (GTIIT). Typical focus ion beam (FIB) Sample preparation for transmission electron microscope (TEM) was carried out using a Thermo Scientific Helios 5 DualBeam (SEM/FIB) system. Typical focused ion beam (FIB) procedures were applied to TEM sample preparation and low voltage (5 kV and 2 kV) was used for the final polishing to reduce ion-beam-related sample amorphous damage. High-resolution TEM (HRTEM) observations were conducted in a ThermoFisher Talos F200X TEM operated at 200 kV and images were recorded using Ceta 16M camera 200 kV and Velox Imaging software. Energy Dispersive X-ray Spectroscopy (EDS) experiments were conducted in a ThermoFisher Talos F200X TEM with Super-X EDS Detector. The data analysis for lattice mismatches was done using the line profiles along the spots generated by the Velox™ user interface from ThermoFisher Scientific™. The FFT simulation is generated using the SingleCrystal™ software.
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7

Atomic-Scale Characterization of Thin Film YFO

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Cross-sectional samples of thin film YFO were prepared for electron microscopy by mechanical wedge polishing and final thinning, using cryogenic Ar-ion milling. STEM analysis was performed with a probe corrected Thermo Fisher Scientific Titan G3 60-300 kV operated at 200 kV with a probe convergence semiangle of 18 mrad. A collection semiangle range of 63–200 mrad was used for STEM imaging. Atomic resolution EDS elemental maps were collected with a Thermo Fisher Scientific Super-X EDS detector, and Y and Fe elemental maps were denoised using nonlocal principal component analysis, and gaussian blurring using an open-source Matlab script41 . The Y/Fe ratio was quantified using the stoichiometric YFO target as reference. PACBED patterns were simulated with a custom Python-based STEM simulation, using the multislice approach42 .
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