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Smartlab 9 kw x ray diffractometer

Manufactured by Rigaku
Sourced in Japan

The Smartlab 9 kW X-ray diffractometer is a high-performance analytical instrument designed for advanced materials characterization. It utilizes a 9 kW X-ray source to provide high-intensity X-rays for analyzing the crystalline structure of a wide range of materials. The Smartlab 9 kW X-ray diffractometer is capable of performing various X-ray diffraction techniques, including powder diffraction, thin-film analysis, and single-crystal studies.

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6 protocols using smartlab 9 kw x ray diffractometer

1

Characterization and Purification of Titanium Particles

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Pure titanium (Ti) particles (>93% in purity and < 20 μm in diameter) were supplied by Alfa Aesar (#000681, Heysham, UK). Characterization of their morphology and size has been previously reported 40 (link), 41 (link). The sizes of these particles were in the range of 0.9-5.7 μm and their average size was 3.3 μm 40 (link), 41 (link). To remove endotoxins, the particles were baked at 180 °C for 6 h, followed by immersing in 75% ethanol for 48 h as previously described 42 (link). After being washed four times with sterile ultra-pure water, Ti particles were re-suspended in sterile PBS at a concentration of 1 g/ml for further use. Morphology of Ti particles before and after being baked for 6 h at 180 °C was observed and imaged by a scanning electron microscope (FEI Quanta 250, Hillsboro, OR, USA). The effect of the baking treatment on the phase composition of Ti particles was analyzed by X-ray diffraction (XRD) using a SmartLab 9kW X-ray diffractometer (Rigaku, Tokyo, Japan) with CuKa radiation (40Kv, 150mA) in a 2θ range of 5-90° at a step size of 0.02° and a scanning speed of 6°/min.
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2

Morphological and Structural Characterization of WS2 Thin Films

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The WS2 thin film surface morphology was characterized by scanning electron microscopy. A JEOL 6490 microscope was used to take SEM image for the investigation of the film microstructure using an accelerating voltage of 30 kV. The thin film crystal structure was analyzed by high resolution X-ray diffraction using a Rigaku Smartlab 9 kW X-ray diffractometer, employing Cu-Kα1 radiation source (λ = 1.5406 Å) accompanied by a two-crystal Ge (220) two-bounce hybrid monochromator. Phonon behaviors were investigated by Raman microscope of backscattering configuration with excitation wavelengths of 488 nm. The XPS measurements were carried out on a SKL-12 spectrometer equipped with Al Kα X-ray radiation source. C 1 s peak (284.6 eV) was used for calibrating the XPS spectra to compensate the surface charge effect.
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3

2D Square Micelle WXRD Characterization

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The wide-angle X-ray diffraction (WXRD) samples for detecting were prepared by drop-coating about 15 μl of the 2-D square micelle solution onto a pre-cleaned and treated silicon wafer and evaporating the solvent 2-PrOH for 10 times. The silicon wafer was treated the same with AFM substrates as described above. The WXRD spectrum was recorded using a Rigaku Smartlab 9 kW X-ray diffractometer using CuKα radiation (λ = 1.5418 Å).
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4

Synthesis and Characterization of RpDAE-ZIF67

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RpDAE-ZIF67 was synthesized by in situ approach in the aqueous solution. Experimentally, 2 ml of purified RpDAE (2 mg/ml) and 2 ml of cobalt nitrate hexahydrate (0.04 M) were mixed with 2-methylimidazole (1.2 M, 2 ml) in distilled water and stirred for 1 h at ambient temperature. The sample solution was aged for 7 h and collected by centrifugation at 6,000 rpm for 20 min. Subsequently, samples were washed three times with distilled water. It was freeze-dried for 12 h. PXRD data were collected by SmartLab 9 kW X-ray diffractometer (Rigaku, Tokyo, Japan) with Cu-Kα radiation at 2θ from 5° to 40°. FT-IR measured was performed by Nicolet iS20 spectroscopy (Thermo Scientific, MA, USA) in the range of 400–2,500 cm−1.
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5

Characterization of Porous Chitosan/Saccharomycetes Microspheres

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The structures of the porous chitosan/saccharomycetes microspheres were characterized by using a Smartlab 9 kW X-ray diffractometer (Rigaku, Tokyo, Japan) with 9 kW radiation at 45 KV and 200 mA. The XRD was recorded over the angle of 5–70° at a speed of 4°/min.
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6

Magnesium-Reinforced Polymer Scaffold Characterization

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Magnesium chloride, gallic acid and 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP, 99.5%) were purchased from Macklin (Shanghai, China). Poly (d,l-lactide-co-glycolide) (LA:GA = 75:25, MW = 80,000) was purchased from Jinan Daigang (Jinan, China). KOH was purchased from Sinopharm Chemical Reagent (Shanghai, China).
The morphology and surface characteristics were characterized under a NOVA NanoSEM 450 Field Emission Scanning Electron Microscope (FESEM, FEI, USA), the chemical composition was recorded by attenuated total reflection-fourier transform infrared spectra (ART-FTIR, ThermoFisher, USA), the X-ray diffraction (XRD) patterns were obtained from SmartLab 9 KW X-ray diffractometer (Rigaku, Japan). The thermal stability of the scaffolds was obtained by thermogravimetric analysis (TGA, Mettler Toledo, Switzerland) and the hydrophilicity was obtained through a water contact angle tester (WCA, Kruss, Germany). The concentration of magnesium ions released from the scaffolds were measured by inductively coupled plasma atomic emission spectrometer (ICP-AES, Perkinelmer, USA). The Brunauer−Emmett−Teller (BET) method was utilized to evaluate the surface area and porosity measurements, and performed on a Autosorb iQ analyzer (Quantachrome, USA).
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