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Tap300gd g cantilevers

Manufactured by Budget Sensors
Sourced in Bulgaria

The TAP300GD-G cantilevers are a type of lab equipment produced by Budget Sensors. They are designed for use in various scientific applications. The core function of these cantilevers is to provide a platform for measuring and analyzing samples at the microscale or nanoscale level.

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4 protocols using tap300gd g cantilevers

1

Collagen Gels with Royal Jelly Exosomes

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Collagen gels at a concentration of 2 mg/ml (favorable concentration determined in
microvesicle release experiments) were prepared on ice, with and without RJ exosomes
(2.5 × 109/ml). Fifty microliter gels in a 96 well plate were left to
polymerize for 30 min at 37 °C. Gels were then covered with PBS for 5 h and mildly fixed
by immersion in paraformaldehyde 4% (Sigma, US) for 30 mins. Samples were immediately
washed twice with distilled water and kept at 4 °C until atomic force microscopy (AFM)
experiments (within 24 h). For AFM imaging, gels were physiosorbed onto a clean glass
cover slips and immediately placed under a MFP 3D-SA AFM (Asylum Research, US). Images of
5 × 5 µm and 2 × 2 µm were obtained for both conditions in AC mode, employing TAP300GD-G
cantilevers (k ∼ 40 N/m, ∼300 kHz, BudgetSensors, Bulgaria).
Height and amplitude channel data was recorded and processed with proprietary Asylum
Research AFM software (v16.10.211).
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2

Surface Characterization of Modified QCM Sensor

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The new QCM sensor
modified with 2 mM MUDA was examined before and after eIP immobilization
on the surface by employing microscopic techniques. The atomic force
microscopy (AFM) measurements were performed by a NanoWizard II system
(JPK Instruments AG., Germany) to obtain 2D surface topography, the
root-mean-square (RMS) roughness, and phase images. The measurements
were acquired at room temperature with dry samples in intermittent
contact mode employing TAP300 GD-G cantilevers from Budget Sensors
(Innovative Solutions Bulgaria Ltd., Bulgaria). The resonance frequency
of the cantilevers was 200–400 kHz with a force constant of
40 N/m. The scanning rate throughout the measurements was kept at
0.3–0.2 Hz. The samples were investigated in 10 × 10 μm
scanning areas, and the JPKSM Data Processing software was used for
data evaluation. Fluorescence microscopy images were recorded using
a Keyence compact fluorescence microscope BZ-X810 (Keyence, Osaka,
Japan) under 10× magnification and further analyzed with BZ-X800
Analyzer software.
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3

Atomic Force Microscopy of RJEV Vesicles

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RJEV shapes were confirmed using AFM, as previously described.58 (link) Briefly, freshly cleaved mica discs (12-mm diameter; Electron Microscopy Sciences, US) were coated with 50 μL of a 0.1 M solution of poly-L-lysine (PLL) for 5 min. Subsequently, discs were washed three times with double-distilled H2O (ddH2O) and dried with a gentle stream of N2. RJEVs were then immobilized onto the PLL-coated mica by incubation for 30 min at room temperature. Samples were covered to avoid drying and potential dust contamination. After incubation, specimens were washed three times with ddH2O and mounted onto an Asylum MFP 3D-SA AFM (Asylum Research, US). Samples were analyzed in intermittent contact mode (alternating current [AC] mode) with TAP300GD-G cantilevers (BudgetSensors, Bulgaria), obtaining height, amplitude, and phase channel images of substrates under environmental conditions. From the resulting height images, the surface profiles, maximum and mean vesicle height, and RMS roughness of RJEVs were calculated in the Gwyddion 2.56 software. RJEVs from three independent sample preparations were utilized for all AFM-based experiments.
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4

Nanomechanical Analysis of Extracellular Vesicles

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For all AFM imaging, an Asylum MFP 3D-SA AFM (Asylum Research, US) was utilized in intermittent contact mode (AC mode) with TAP300GD-G cantilevers (BudgetSensors, Bulgaria), obtaining height, amplitude, and phase channel images of substrates in air. For HEc-EV nanomechanical analysis, individually calibrated MNSL-10 cantilevers (0.1N/m, Bruker, US) were employed to obtain force-distance curves on the surface of selected EVs in buffer, with a soft loading force of 0.5nN and a 2µm/s rate. HEc-EVs from three independent sample preparations were utilized for all AFM-based experiments.
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