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Model 2100

Manufactured by JEOL
Sourced in Japan

The JEOL model 2100 is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a LaB6 electron source, a high-resolution objective lens, and advanced imaging capabilities. The JEOL 2100 is capable of achieving a resolution of 0.25 nanometers, making it suitable for a wide range of applications, including materials science, nanotechnology, and life sciences research.

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4 protocols using model 2100

1

TEM Characterization of Biosynthesized AgNPs

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The biosynthesized AgNPs were morphologically characterized by a transmission electron microscope (JEOL model 2100, Japan). The microscope was operated at an optimum accelerating voltage of 200 kV. A few drops of re-dispersed AgNPs were placed on a carbon-coated copper TEM grids and allowed for 10 min to settle down, followed by observation under the microscope.
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2

Comprehensive Polymer Characterization

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The FTIR spectra of the polymers were obtained using a Bruker Equinox 55 Fourier transform infrared spectrometer (Bruker, Billerica, MA, USA) (frequency range 4,000 to 500 cm-1). The UV-vis spectra of the samples were recorded on a UV-vis spectrophotometer (UV4802, Unico, Dayton, NJ, USA). Raman spectra were recorded in a backscattering geometry with a 1,064-nm excitation wavelength using a Bruker Vertex 70 FT infrared spectrometer (equipped with RamIIFT Raman Module). XRD patterns have been obtained using a Bruker AXS D8 diffractometer with a monochromatic Cu-Kα radiation source (λ = 0.15418 nm); the scan range (2θ) was 10° to 80°. Morphology and microstructure of the samples were investigated by FESEM (Hitachi S-4800, Hitachi Ltd., Chiyoda-ku, Japan). TEM measurements were performed on a TEM instrument (JEOL model 2100, JEOL Ltd., Tokyo, Japan).
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3

Virus Ultrastructure Characterization by TEM

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Virus samples were treated with MβCD for 30 min at 37 °C before being washed thrice at 2000 × g for 3 min each in Amicon concentrators (100 kDa MWCO). Samples were fixed in solution containing 1% para-formaldehyde and 0.1% glutaraldehyde at 4 °C for 15 min. Samples were washed again before being mixed with 1% osmium tetroxide and incubated with gentle shaking at 4 °C for 1 h. Samples were washed seven times with deionized water before being concentrated to a volume of 100 μL and loaded on lacey carbon grids (EM Microscopy) and dried overnight. Just before imaging, samples were stained with 0.1% uranyl acetate and rinsed. Imaging was performed on a transmission electron microscopy (TEM) system (JEOL, Model 2100) at 120 keV.
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4

Characterization of Nanocomposite Films

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The cross-sectional scanning electron microscope (SEM) images of the nanocomposite films were captured using the Tescan-MIRA field-emission scanning electron microscopy. The morphology of the Fe3O4 nanoparticles was analysed by transmission electron microscopy (JEOL, model 2100). The tensile behaviours of the (4 mm × 25 mm) composite films were measured by applying a 1 mm/min load using the MTS Tytron 250 Micro-force Tester. The toughness, defined as the ability of a material to absorb energy up to fracture, was calculated using the OriginPro 8.5 software by integrating the area under the tensile stress-strain curves. The NETZSCH STA 449F3 instrument was used to perform the thermogravimetric analysis (TGA), and the samples were heated from 30 °C to 800 °C in N2 atmosphere with a heating rate of 5 °C/min. Fourier transform infrared spectroscopy (FTIR) spectra were obtained using an ATR spectrometer (5700 Nicolet Diamond). The X-ray diffraction (XRD) data were collected using the Bruker D8 with Cu Kα radiation.
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