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Fluorolog 3 11

Manufactured by Horiba
Sourced in Japan

The Fluorolog 3-11 is a spectrofluorometer designed for the measurement of fluorescence spectra. It features a Xenon lamp source, double-grating monochromators for both excitation and emission, and a photomultiplier tube detector. The instrument can be used to acquire emission, excitation, and synchronous fluorescence spectra.

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5 protocols using fluorolog 3 11

1

Comprehensive Characterization of Materials

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Transmission electron microscopy (TEM) observations were performed on a Tecnai F20 microscope. Atomic force microscope (AFM) measurements were carried out with Veeco Dimension 3100V. X-ray photoelectron spectroscopy (XPS) was carried out with ESCALAB 250Xi (Thermo Scientific, Waltham, MA, USA). Fourier transform infrared (FT-IR) spectra were obtained on a Nicolet 6700 FT-IR spectrometer (Thermo Nicolet Corp., Madison, WI, USA). Photoluminescence emission and excitation spectra were measured on a Hitachi F-4600 spectrophotometer (Hitachi, Tokyo, Japan) equipped with a Xe lamp at ambient conditions. UV-Vis absorption spectra were recorded on a PERSEE T10CS UV-Vis spectrophotometer (Persee, Beijing, China). PL lifetime was measured using Fluorolog 3-11 (HORIBA Jobin Yvon, Kyoto, Japan). PL Quantum yields were measured on a QE-2100 quantum efficiency measurement system (Otsuka Electronics, Japan). Photographs were taken using a Canon camera (EOS 550, Tokyo, Japan) under excitation by a hand-held UV lamp (365 nm).
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2

Characterization of Co-oligomers via Spectroscopic Analysis

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IR spectra of co-oligomers were taken on FT-IR spectrophotometer (Shimadzu, Model IRA Affinity-1) in the form of KBr pellets. The integrated absorption coefficient was determined using the IRA Affinity-1 software through Gaussian Lorentzian curve fittings. Ultraviolet-visible light (UV-vis) spectra were taken on UV-vis spectrophotometer (Shimadzu, Model UV-1800). The viscosity of the co-oligomers was determined at 25 °C temperature using Ubbehlode viscometer. XRD patterns of the co-oligomers were recorded on a powder diffractometer (Philips, Model PW 3710) (using a nickel-filtered Cu-Kα radiation). Peak parameters were analyzed via Origin Pro 8 software. Fluorescence studies were performed on fluorescence spectrophotometer Fluorolog @ 3–11 (Horiba) The quantum yield was calculated as per the method reported in our earlier studies.4 (link)
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3

Tryptophan-based Thermofluorescence Assay

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Fluorescence spectra were measured on Fluorolog 3.11 (Horiba) for tryptophan (NATA) at 22 μM in water, 1:1 water:methanol, methanol, propan-2-ol, while for SD at 2 μM and eIF4E at 2.75 μM in buffer, in a thermostatted micro-cuvette (Hellma) at 15 °C, with excitation wavelength of 280 nm. Concentrations of proteins and NATA were chosen to have equimolar amounts of tryptophan residues in each sample. Energy at maximum of the fluorescence spectra was calculated as: E=hc/λmax, where h was the Planck constant, c was the speed of light in vacuum, λmax was the wavelength of the maximum.
During the tryptophan-based thermofluorescence assay, the fluorescence emission signals at 350 and 330 nm were measured every 10 s with the integration time of 4.6 s, at the excitation wavelength of 280 nm. The temperature gradient was 1 °C/min. The actual temperature was measured inside the cuvette with the thermocouple and recorded by the thermostat. The assay for SD was repeated five times at different SD concentrations, from 1 to ~13 μM. The assay for eIF4E was performed at 2.75 μM. The melting temperature was determined from a non-linear fitting of the Boltzmann sigmoidal curve: F350/F330T=FFi+FFfFFi/1+expTmT/slope, where Tm was the melting temperature in °C, slope was a cooperativity coefficient, FFi and FFf were the initial and final plateau, respectively.
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4

Comprehensive Characterization of Luminescent Materials

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Transmission electron microscopy (TEM) observations were performed on a Tecnai F20 microscope. X-ray photoelectron spectroscopy (XPS) spectra were carried out with ESCALAB 250Xi (Thermo Scientific). Scanning electron microscopy (SEM) was performed on a JEOL FESEM 6700F microscope with a primary electron energy of 3 kV. X-ray powder diffraction (XRD) patterns were recorded on a Rigaku D/max-2000 X-ray powder diffractometer (Japan) using Cu Kα (1.5406 Å) radiation. Fourier transform infrared (FT-IR) spectra were obtained on a Nicolet 6700 FT-IR spectrometer. Photoluminescence (PL), afterglow emission and excitation spectra were measured on a Hitachi F-4600 spectrophotometer at ambient conditions. For the temperature-dependent experiment, the sample was placed in a high temperature fluorescence attachment (Orient KOJI, TAP-02) with temperatures controlled between 298.15 and 523.15 K. UV–Vis absorption spectra were recorded on a PERSEE T10CS UV–Vis spectrophotometer. PL and afterglow lifetimes were measured using Fluorolog 3–11 (HORIBA Jobin Yvon). PL quantum yields (QYs) were measured on a QE-2100 quantum efficiency measurement system (Japan Otsuka Electronics). Photographs of PL and afterglow were taken using a Canon camera (EOS 550) under excitation by a hand-hold UV or LED lamps.
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5

Optical Characterization of Thin Films

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UV–vis
absorption of the thin films was measured using a UV–vis absorption
spectrophotometer (Varian, Cary 300) in the wavelength range of 400–850
nm. Steady-state photoluminescence emission (PL) and time-resolved
photoluminescence (TRPL) were measured using a PL spectrophotometer
(Fluorolog 3-11, Horiba) using 400 nm excitation wavelength for PL
and TRPL at the wavelength corresponding to the maximum intensity
by employing a pulsed laser (NanoLED-405L, <100 ps of pulse width,
1 MHz frequency). Photoluminescence quantum yield (PLQY) was measured
using a Hamamatsu PLQY absolute QY measurement system C9920-02, coupled
to an integrating sphere, at an excitation wavelength of 400 nm. The
obtained values were adjusted in an absorbance range around 0.5 to
conduct the measurements, these values being suitable to achieve the
maximum PLQY in the samples.
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