To detect elemental composition in GX (CP) or GX (IO), Scanning transmission electron microscopy – Energy-dispersive X-ray spectroscopy (STEM-EDS) was used. To perform measurements, carbon-coated copper grids with air-dried nanoparticles were inserted using a single-sample low-background double-tilt holder. After STEM alignment, STEM microscopy was performed at 200 kV in high angle annular dark field (HAADF) imaging mode. The STEM-EDS map acquisitions were then performed using a 30 mm2 active area Bruker Silicon Drift Detector with a super light element window. Final spectral plots were then collected and saved using Bruker ESPIRIT software.
Silicon drift detector
Manufactured by Bruker
The Silicon Drift Detector (SDD) is an energy-dispersive X-ray spectroscopy (EDS) detector used in various analytical instruments. It is designed to detect and analyze the energy of X-rays emitted from a sample during electron beam excitation, such as in scanning electron microscopes. The core function of the SDD is to provide high-resolution X-ray spectroscopy with high count rate capabilities, enabling efficient elemental analysis of materials.
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Lab products found in correlation
Espirit software, by Bruker (1 mentions)
500 mhz spectrometer, by Agilent Technologies (1 mentions)
Supra 40, by Zeiss (1 mentions)
Uv 2001 spectrophotometer, by Shimadzu (1 mentions)
6530 accurate mass q tof lc ms spectrometer, by Agilent Technologies (1 mentions)
Axioplan 2, by Zeiss (1 mentions)
Sx100, by Cameca (1 mentions)
Jsm 7800f, by JEOL (1 mentions)
4 protocols using silicon drift detector
1
Elemental Composition Analysis of G^X Nanoparticles
2
Detailed Characterization of Cobalt Catalyst
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An X-Ray Photoelectron Spectrometer THERMO-VG ESCALAB 250 (RX source K AI (1486.6 eV)) was used. X-ray absorption spectra were collected at the LUCIA beamline of SOLEIL with a ring energy of 2.75 GeV and a current of 490 mA. The energy was monochromatized by means of a Si (111) double crystal monochromator. Data were collected in a primary vacuum chamber as fluorescence spectra with an outgoing angle of 5° using a Bruker silicon drift detector. The data were normalized to the intensity of the incoming incident energy and processed with the Athena software from the IFEFFIT package. For the EXAFS analysis, an E0 value of 7715.4 eV was used for the cobalt K-edge jump energy. SEM using a field emission gun was performed using a Zeiss Supra 40. Infrared spectra (IR) were recorded on a Bio-Rad FTS 175 C Fourier transform infrared spectrometer spectrophotometer. Ultraviolet (UV)–visible absorption spectra were obtained using a Shimadzu 2001 UV spectrophotometer. High resolution mass spectra were measured on an Agilent 6530 Accurate-Mass Q-TOF LC/MS spectrometer equipped with electrospray ionization source. NMR spectra were recorded in deuterated chloroform (CDCl3) and THF-d8 on a Varian 500 MHz spectrometer. Melting points were recorded on a Stuart SMP apparatus.
3
Scanning Electron Microscopy of HF-FPW Sediments
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To conduct scanning electron microscopy (SEM), HF-FPW sediments and solids were collected by passing the sample of HF-FPW through a 0.45 µm cellulose nitrateacetonitrile filter. The sediment was then rinsed while on the filter with 18MΩ ultrapure water to remove any residual brine and to prevent salt precipitation within the sample, covered, and air dried. The samples were then mounted adhesive carbon tape on aluminum SEM tabs (Ted Pella, Inc., Redding, CA), which were then carbon coated using a Nanotek SEMprep 2 sputter coater. Imaging was performed using a Zeiss EVO LS15 SEM with a LaB6 crystal and equipped with a Bruker silicon drift detector for energy dispersive X-ray analysis (EDX) with a peak resolution of 125 eV and a resolution of 100 nm. SEM analyses were performed on the TS fraction of the HF-FPW sample.
4
Microstructural Analysis of AlPd15B7 Alloy
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A small piece of the as-cast AlPd 15 B 7 sample was embedded in a conductive resin and then subjected to a multistep grinding and polishing process to achieve a high-quality surface. The microstructure observations were performed on an optical microscope (Axioplan 2, Zeiss) as well as on a scanning electron microscope (JSM-7800F, JEOL). The chemical composition of the observed phase was analysed by means of energy dispersive X-ray spectroscopy (EDXS, Quantax 400 EDXS system, Silicon Drift Detector, Bruker) and wavelength dispersive X-ray spectroscopy (WDXS, SX 100, Cameca) using Al K α , Pd L α , and B K α signals with elemental Al and Pd 3 B as standards. The Al : Pd atomic ratio of the studied phase from EDXS and its composition from WDXS were measured to be 0.9(1) : 15.0(1) and Al 4.6(2) Pd 66.5(2) B 28.9(1) , respectively, in good accordance with the theoretical values (1 : 15 and Al 4.35 Pd 65.22 B 30.43 , respectively).
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