D8 discover x ray diffraction system

Scanning electron microscope (SEM) (Hitachi S-3000N VPSEM) equipped with energy-dispersive X-ray spectroscopy (EDS) and field emission scanning electron microscope (FESEM) (JEOL JSM-6320F) were used to investigate surface morphology and elemental compositions. In addition, the nanostructures of the HA nanofibers and the 2D were observed under scanning transmission electron microscopy (STEM) (JEOL JEM-ARM200CF). The XRD patterns were recorded using a Bruker D8 Discover X-ray diffraction system equipped with a copper sealed X-ray tube source, producing Cu-Kα (λ = 1.5418 Å). The diffractometer was operated at 40.0 kV and 40.0 mA at a 2θ range of 5–60° with a step size of 0.02 and an exposure time of 1 s/step.

TEM images were taken by using a TECNAI G2 high‐resolution transmission electron microscope. XPS measurements (VG ESCALAB MKII) were used to analyze the elemental valence states of SENDs. FTIR was recorded on a Bruker Vertex 70 spectrometer (2 cm⁻¹). UV –vis spectra were collected using a VARIAN CARY 50 UV/Vis spectrophotometer. The fluorescence spectra were determined by using an F98 spectrofluorometer. The XRD measurements were carried out using a Bruker D8 Discover X‐ray Diffraction System.

For XRD measurements a Bruker D8 Discover X-Ray Diffraction system with a Cu Kα₁ radiation source employing a wavelength of 1.5418 Å was used. A Vantec-1 detector was used with a slit of 1 mm and the power rating of X-ray generator was set to 40 kV and 40 mA. The 2θ range of the measurements were between 10–90° with a step size of 0.01263°. A double sided tape was used to fix approximately 10 mg of sample on a glass slide. This glass slide was placed on a gum to attach it to a sample holder. Background signal generated by the tape was subtracted during investigation of the phases. ICDD PDF-4 2014 database was used for phase identification.