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Nanoscope software

Manufactured by Digital Instruments

Nanoscope software is a core component of Digital Instruments' scanning probe microscopy systems. It provides an intuitive interface for controlling the microscope hardware, acquiring and processing imaging data, and analyzing sample topography.

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4 protocols using nanoscope software

1

Measuring Cellular Elasticity via AFM

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Single dissociated cells were put on a glass bottom dish in 1×MBS-H. They were compressed using a Bioscope Atomic force microscope (AFM) (Veeco) mounted on an inverted optical microscope (Axiovert S100 TV; Zeiss) with a Silicon Nitride cantilever with a nominal spring constant of K = 0.01 (MLCT; Veeco) mounted with a 10 µm polystyrene bead (Polysciences). Force-distance (FD) curves were obtained with the Nanoscope software (Digital Instruments). FD curves were plotted as the deflection of the cantilever as it was lowered in the z-axis to make contact with, and compress single cells. The elastic modulus was calculated by fitting the first 200 nm of each FD curve using a Hertzian compression model for a spherical indenter compressing a spherical substrate. Code kindly provided by X.Y. Chau and P. Grütter, McGill University, available at http://spm.physics.mcgill.ca/research-projects/afm-in-fluids/mechanical-properties-of-neurons. Multiple approaches were taken for each cell and the average elastic modulus for each cell was used as a single data point. Statistical analysis was done using a one-way ANOVA followed by Tukey’s HSD post hoc test for individual comparisons.
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2

Atomic Force Microscopy Sample Preparation

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Sample preparation for atomic force microscopy (AFM) was performed at RT. Typically, 3–6 μl of different ASN species diluted in corresponding buffers to a working concentration of 1 μM were applied to a freshly cleaved muscovite mica substrate (Ted Pella, Redding, CA) and incubated for 1 min. The mica surface was then rinsed with 7–200 μl of double-processed tissue culture water (Sigma-Aldrich, St. Louis, MO, USA) to remove salts and loosely bound proteins. AFM images were recorded on a MultiModeTM SPM (Digital Instruments, Santa Barbara, CA) equipped with an E-Scanner using etched silicon NanoProbes (model RTESP; Veeco Instruments, Mannheim, Germany). All measurements were performed in the tapping mode with scan rates of ~ 0.5 Hz. Images were processed using NanoScope software (Digital Instruments).
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3

Atomic Force Microscopy Surface Characterization

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NanoScope
IV Multimode and
Dimension 3100 (Digital Instruments, Santa Barbara, CA) atomic force
microscope were used to thoroughly characterize the surfaces’
topography. The AFM measurements were performed using tapping mode
via an intermittent contact of the tip with the sample, in ambient
conditions. NSG 20 cantilevers with a resonance frequency of 260 kHz
and a stiffness of 28 N/m were used. Height and phase images were
analyzed with the Nanoscope software (Digital Instruments). To improve
contrast, patterns were exposed to UV-light and rinsed in cyclohexane
to remove some of the PS phase.
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4

AFM Imaging of Peptide-Treated Graphene

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AFM measurements were performed on a MultiMode Nanoscope IVa AFM (Digital Instruments, Santa Barbara, CA) in tapping mode under ambient conditions. TESP silicon probes (Veeco, Santa Barbara, CA) were used with a nominal spring constant of 42 N m À1 . For sample preparation, a drop of 10-15 mL of the peptide-treated graphene dispersion was pipetted onto a freshly cleaved mica surface. After adsorption for 10-30 s, the sample was dried with a nitrogen stream. Tapping mode images were recorded as 512 Â 512 pixel images. Image analysis was carried out using the Digital Instruments Nanoscope software (version V530r3sr3).
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