Vg escalab 250 x ray photoelectron spectrometer

The morphology images were recorded on Zeiss SUPRA55 scanning electron microscope (SEM), which combined with energy‐dispersive X‐ray spectroscopy (EDX), and transmission electron microscopy (TEM) (Philips Tecnai 20 and JEOL JEM‐2010 high‐resolution TEM). The optical image was performed on a Leica DMI8 fluorescence microscope. X‐ray diffraction (XRD) data were performed on Shimadzu XRD‐6000 X‐ray diffractometer (Cu Kα radiation (0.154 nm) at 40 kV, 30 mA, and scanning rate of 10° min⁻¹). X‐ray photoelectron spectra (XPS) were performed on a Thermo VG ESCALAB 250 X‐ray photoelectron spectrometer (pressure: 2 × 10^–9 Pa; excitation source: Al Kα X‐rays). The aberration‐corrected high‐angle annular dark‐field scanning transmission electron microscopy (HAADF‐STEM) was performed on FEI Titan Cubed Themis G3 300. The Co K‐edge XAS data were collected at the beamline 1W1B of the Beijing Synchrotron Radiation Facility (BSRF), Institute of High Energy Physics (IHEP), and Chinese Academy of Sciences (CAS). Contact angle was performed by the sessile drop method in glove box. Crimping and shocking tests were carried out by tablet press (MTI, China) and vortex mixer (TAT, China).

XRD patterns of Ru-x samples were measured on the D8ADVANCE diffractometer equipped with a Kα radiation. The morphologies and particle size of different Ru crystals were investigated by high-angle annular dark-field scanning transmission electron microscopy (HADDF-STEM) images on a JEOL-2100F FETEM. XPS spectra were conducted over a Thermo VG ESCALAB250 X-ray photoelectron spectrometer. UPS measurements were performed on a UV/VIS spectrometer Lambada 25. The mass loadings of Ru on the porous carbon substrate were measured by ICP-AES (Shimadzu ICPS-7500 spectrometer). BET surface area was determined through low-temperature N₂ adsorption-desorption experiments on a Micromeritics ASAP 2020 sorptometer.

X-ray diffraction (XRD) patterns were collected on a Rigaku XRD-6000 diffractometer using Cu Kα radiation from 3° to 80° at the scan rate of 10° min⁻¹. The morphologies were investigated via SEM (Zeiss SUPRA 55) at an accelerating voltage of 20 kV. A Brunauer–Emmett–Teller (BET, ASAP 2460) apparatus was used to measure the surface area. HRTEM images were recorded using a JEOL JEM-2010 field-emission transmission electron microscope at an accelerating voltage of 200 kV, combined with energy-dispersive X-ray spectroscopy (EDS). XPS measurements were performed on a Thermo VG ESCALAB 250 X-ray photoelectron spectrometer with Al Kα radiation at a pressure of about 2 × 10⁻⁹ Pa. Inductively coupled plasma-optical emission spectrometry (ICP-OES) was adopted to analyze the chemical components of the catalysts.