The crystallinity of the raw mica sample and ANPM were analysed using X-ray diffraction patterns from a Siemens D5000 Powder X-ray Diffractometer, with the Cu Kα radiation of wavelength λ = 0.1540562, and the scan rate of 1° min−1. The obtained XRD patterns were analysed using the X Powder 12 Software with the help of the ICDD PDF2 database. Average crystallite size of the synthesized product was calculated by using the Debye–Scherrer equation which is applied to the major XRD peaks of materials.
D 5000 powder x ray diffractometer
Manufactured by Siemens
Sourced in Germany
The D-5000 powder X-ray diffractometer is a compact and versatile laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to identify and characterize the atomic and molecular structure of various solid-state samples. The core function of the D-5000 is to provide accurate and reliable data on the phase composition, crystal structure, and other structural properties of powdered or polycrystalline materials.
Automatically generated - may contain errors
Lab products found in correlation
Via reflex raman microscope, by Renishaw (1 mentions)
Jem 1010 instrument, by JEOL (1 mentions)
Jsm 6700f, by JEOL (1 mentions)
Ccd camera, by JEOL (1 mentions)
1600 spectrophotometer, by PerkinElmer (1 mentions)
Xl 30 esem scanning electron microscope, by Philips (1 mentions)
Jem 2010, by JEOL (1 mentions)
Emx epr spectrometer, by Bruker (1 mentions)
Uv 2550 spectrometer, by Shimadzu (1 mentions)
6 protocols using d 5000 powder x ray diffractometer
1
Crystallinity Analysis of Mica and ANPM
2
Structural Characterization of Materials
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X-ray diffraction (XRD) patterns were collected using a Siemens D-5000 powder X-ray diffractometer operated in Bragg Brentano geometry using Ni-filtered Cu Kα radiation (λ = 0.1541 nm). Data were recorded in the 2θ range 10–80° with an angular step size of 0.026° and a counting time of 1 s per step. The collected data were refined using the Le Bail method by means of the software Rietica [34 (link),35 (link)]. Raman spectra were collected from powder samples onto a glass slide as substrate, with a Renishaw in Via Reflex Raman microscope (Renishaw, Gloucestershire, UK). Experiments were conducted at room temperature using 532 and 633 nm excitation wavelengths. Field emission scanning electron microscopy (FESEM) was conducted on a JEOL JSM-6700 F. Samples for transmission electron microscopy (TEM) studies were prepared by dropping a diluted suspension of the samples onto ultra-thin carbon-coated copper grids. Imaging was performed on a JEOL JEM 1010 instrument operated at 100 kV and equipped with a CCD camera (JEOL, Tokyo, Japan).
3
Structural and Morphological Analysis of Polyaniline
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The Fourier-transform infrared (FTIR) spectra of the polyaniline were recorded on a Perkin Elmer 1600 spectrophotometer in KBr medium in the wave number range 400–4600 cm−1. The prepared samples were ground with KBr in the ratio of 1:5 until it forms homogeneous powder, which is later pressed into a 10 mm plate with the help of a hydraulic press. The diffraction patterns were captured in the range 10–80° under 2 Theta using a Siemens D-5000 powder X-ray diffractometer with CuKα source radiation at a wavelength of 1.54°. The surface morphology of polyaniline in the form of powder coated with gold particles by sputtering was investigated employing Philips XL 30 ESEM scanning electron microscope on a gold substrate. The contact angle is measured using the Theta Optical Tensiometers, NanoScience Instrument Ltd., Alexandria, VA, USA.
4
Powder XRD Analysis of Samples
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XRD analysis was conducted using a Siemens D5000 powder X‐ray diffractometer (Siemens Healthineers, Henkestraße 127, 91052 Erlangen, Germany). Samples were ground to a fine powder using a mortar and pestle before being applied to PVC slides. Diffraction patterns were recorded using angular increments of 0.1° 2Θ from 3° to 60° 2Θ, at a rate of 1° 2Θ/min. A Cu‐Kα source was used, operating at 40 mA and 40 kV, with a scintillation detector. Reference patterns were obtained from the International Centre for Diffraction Data (IDCC) database.
5
Comprehensive Nanoparticle Characterization Protocol
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The morphology of the nanoparticles
was evaluated using a FEI-235 scanning electron microscope (SEM),
operating at an accelerating voltage of 15 kV. To obtain high-resolution
(HR) SEM images, all samples were deposited on silicon wafers. Transmission
electron microscopes (TEMs); FEI G2, JEOL 2000 FX, and JEM 2010 equipped
with energy-dispersive spectrometers; were operated at either 100
or 200 kV. Conventional and HR TEM imaging, selected area electron
diffraction (SAED), and EDX spectroscopy, including elemental mapping
methods, were used for analysis of the nanoparticles. All TEM samples
were deposited on 300 mesh holey carbon-coated copper grids and dried
before analysis. UV–visible (UV–vis) extinction spectra
were obtained using a Cary 50 Scan UV–vis spectrometer over
the wavelength range of 200–1100 nm. A Siemens D-5000 powder
X-ray diffractometer equipped with a monochromatic Cu Kα (λ
= 1.540562 Å) radiation source was used to analyze the samples
over the 2θ range 5–90° in steps of 0.02°.
The concentrations of the suspensions at each step of the synthesis
procedure were measured with a Malvern Instruments NanoSight NS300
nanoparticle tracking system.
was evaluated using a FEI-235 scanning electron microscope (SEM),
operating at an accelerating voltage of 15 kV. To obtain high-resolution
(HR) SEM images, all samples were deposited on silicon wafers. Transmission
electron microscopes (TEMs); FEI G2, JEOL 2000 FX, and JEM 2010 equipped
with energy-dispersive spectrometers; were operated at either 100
or 200 kV. Conventional and HR TEM imaging, selected area electron
diffraction (SAED), and EDX spectroscopy, including elemental mapping
methods, were used for analysis of the nanoparticles. All TEM samples
were deposited on 300 mesh holey carbon-coated copper grids and dried
before analysis. UV–visible (UV–vis) extinction spectra
were obtained using a Cary 50 Scan UV–vis spectrometer over
the wavelength range of 200–1100 nm. A Siemens D-5000 powder
X-ray diffractometer equipped with a monochromatic Cu Kα (λ
= 1.540562 Å) radiation source was used to analyze the samples
over the 2θ range 5–90° in steps of 0.02°.
The concentrations of the suspensions at each step of the synthesis
procedure were measured with a Malvern Instruments NanoSight NS300
nanoparticle tracking system.
6
Comprehensive Catalyst Characterization
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UV–vis
spectra were recorded on a Shimadzu UV-2550 spectrometer over the
250–700 nm wavelength range. The supported catalyst was characterized
by X-ray diffraction (Siemens D5000 powder X-ray diffractometer),
diffuse reflectance Fourier transform spectroscopy (DRIFTS), and thermogravimetric
analysis (TGA) as described previously.36 (link) Metal analyses were performed using an atomic absorption spectrometer
(AA-7000 series; Schimadzu Corporation). A copper hollow cathode lamp
was used with 6 mA current and a 324.8 nm wavelength. The burner height
was set to 7 mm, and the slit width was set to 0.7 nm. The flame composition
was acetylene (flow rate, 1.8 L min–1) and air (flow
rate, 1.8 L min–1). EPR spectra were recorded on
a Bruker EMX EPR spectrometer equipped with a 100 kHz field modulator.
Diphenylpicrylhydrazyl (DPPH) (g = 2.007) was used to
calibrate the spectra.
spectra were recorded on a Shimadzu UV-2550 spectrometer over the
250–700 nm wavelength range. The supported catalyst was characterized
by X-ray diffraction (Siemens D5000 powder X-ray diffractometer),
diffuse reflectance Fourier transform spectroscopy (DRIFTS), and thermogravimetric
analysis (TGA) as described previously.36 (link) Metal analyses were performed using an atomic absorption spectrometer
(AA-7000 series; Schimadzu Corporation). A copper hollow cathode lamp
was used with 6 mA current and a 324.8 nm wavelength. The burner height
was set to 7 mm, and the slit width was set to 0.7 nm. The flame composition
was acetylene (flow rate, 1.8 L min–1) and air (flow
rate, 1.8 L min–1). EPR spectra were recorded on
a Bruker EMX EPR spectrometer equipped with a 100 kHz field modulator.
Diphenylpicrylhydrazyl (DPPH) (
calibrate the spectra.
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