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Tristar 2 3020 system

Manufactured by Micromeritics
Sourced in United States

The Tristar II 3020 system is a fully automated, high-performance surface area and porosity analyzer. It is designed to accurately measure the surface area, pore volume, and pore size distribution of a wide range of solid materials, including powders, porous solids, and thin films. The system uses nitrogen adsorption-desorption techniques to determine these key material properties.

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8 protocols using tristar 2 3020 system

1

Multimodal Characterization of Nanomaterials

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XRD analysis was performed using an X-ray diffractometer (Empyrean; PANalytical, Almelo, The Netherlands). The samples were scanned at 2θ from 0.5 to 2.5° using a step size of 0.0070° and a scanning time of 19.9260 s. Nitrogen adsorption and desorption isotherms were measured using a TriStar II 3020 system (Micromeritics, Norcross, GA, USA). The samples were analyzed at 77.35 K. The adsorption and desorption data were calculated using Brunauer–Emmett–Teller (BET) theory to determine the specific surface area of the samples, and the pore-size distributions and pore volumes were determined using the Barrett–Joyner–Halenda (BJH) theory. Infrared (IR) spectra were obtained using a NICOLET IS 10 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). Microscopic images of nanoscale pore structures were taken using a transmission electron microscope (HT 7700 TEM; Hitachi, Tokyo, Japan) at 120 kV.
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2

Adsorption Isotherms of CO2 and N2

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Before measurements, the samples were pretreated at 200 °C with a N2 flow for 12 h. The CO2 and N2 adsorption isotherms at 0 and 23 °C were obtained using the same Micromeritics Tristar II 3020 system.
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3

Multidimensional Characterization of m-TiO2-C

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The structure and morphology of prepared samples were investigated using scanning electron microscopy (SEM; S-4200 field-emission, Hitachi) and high resolution-transmission electron microscopy (HR-TEM; JEOL JEM-2010). Nitrogen adsorption–desorption analysis was conducted with 77 K with Micromeritics Tristar II 3020 system to estimate pore size and specific surface area. To confirm the specific pore morphology, small-angle X-ray scattering (SAXS) patterns was detected using 4C SAXS beamlines at the Pohang Light Source (PLS). To investigate crystalline phase, X-ray diffraction (XRD) pattern was identified by D/max-2500 a diffractometer (Rigaku, Cu-Kα radiation). The carbon content of m-TiO2-C was estimated using thermogravimetric analysis (TGA; NETZSCH STA 449C). Electron energy loss spectroscopy (EELS) analysis was performed to identify containing elements using energy-filtering transmission electron microscopy (EF-TEM, JM-220FS).
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4

Nitrogen Adsorption-Desorption of MCM NPs

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Nitrogen adsorption–desorption isotherms of MCM and MCM-FBZ NPs were determined using a Micromeritics TriStar™ II 3020 system. The specific surface area was determined by applying the BET method to the isotherm.
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5

Comprehensive Characterization of Graphene Nanoribbons

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The morphology of the as-prepared pGNR@MSN was characterized employing high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and high-resolution transmission electron microscopy (HRTEM) using a JEM-2100 analytical electron microscope (JEOL Ltd., Tokyo, Japan). The crystal structure of the GNRs was measured using X-ray diffraction (XRD; X'Pert PRO MPD, Hol-land Panalytical) with a monochromatic X-ray beam and nickel-filtered Cu Ka radiation and the Fourier transform infrared (FT-IR) spectra of the pGNR@MSN were recorded using a FT-IR spectrometer (Nicolet IS50-Continuum; Thermo Fisher Scientific, Waltham, MA, USA). In addition, the N2 adsorption–desorption isothermal curve was recorded using the TriStar II 3020 system (Micromeritics, USA), and the zeta potential and particle size of the nanoparticles were determined using a Zetasizer Nano ZS90 analyzer (Malvern Panalytical, Malvern, Netherland).
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6

Comprehensive Characterization of Nanomaterials

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Fourier transform infrared (FT-IR) spectra were recorded on a Nicolet 5700 Thermo FT-IR spectrometer using the KBr wafer technique. N2 absorption isotherms were measured at 77 K using a Micromeritics Tristar II 3020 system. The specific surface area and pore size distribution were calculated using Brunauer–Emmett–Teller (BET) and nonlocal density functional theory methods, respectively. Field-emission scanning electron microscopy (FE-SEM) images were obtained using a Hitachi S-4800 electron microscope. Transmission electron microscopy (TEM) observations were conducted on a JEOL-2100F electron microscope. Inductively coupled plasma atomic emission spectroscopy (ICP-AES) was employed to determine Au weight percentage. Confocal microscopy images were taken using a Fluoview FV1000 Confocal Microscope (Olympus Corporation, Tokyo, Japan).
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7

Characterizing MCM and FBZ-MCM Nanoparticles

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The specific surface area, average pore diameter, and pore volume of MCM and FBZ-MCM nanoparticles were compared to those of the FBZ-MCM-BLG nanoparticles using a Micromeritics TriStar™ II 3020 system and the BET method.
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8

Characterization of SBA-15 Pore Structure

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The pore structure of the SBA-15 samples was characterized by N2 physisorption with a Micromeritics TriStarII 3020 system. Samples were degassed at 90 °C (1 h) and then 150 °C (1 h) under N2 flow. Surface areas and pore size distributions were calculated with the Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda (BJH) methods, respectively.
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