Energy-dispersive x-ray analysis (EDS) was performed using an Oxford AZtec 100 EDS detector attached to a Zeiss Gemini 450 SEM. Images were taken at a working distance of 8.5 mm, under 10.00 kV accelerating voltage and 1 nA beam current. Maps were acquired using the AZtecLive software and exported using a binning factor of 2 and smoothing level of 3.
Gemini 450 sem
Manufactured by Zeiss
The Gemini 450 SEM is a scanning electron microscope (SEM) designed and manufactured by Zeiss. It provides high-resolution imaging of samples at the nanoscale level. The Gemini 450 SEM utilizes a field emission gun (FEG) as the electron source and offers advanced features for imaging and analysis.
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Lab products found in correlation
5 protocols using gemini 450 sem
1
SEM-EDS Imaging and Microanalysis
2
Characterization of Sb2Se3 Thin Films
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The plan view scanning electron microscopy (SEM) images of Sb2Se3 thin films were measured using a Zeiss Gemini 450 SEM. X-ray diffraction (XRD) was obtained using the Rigaku Smartlab diffractometer. The Sb2Se3 and Au reference cards were obtained from the Cambridge Crystallographic Data Centre (CCDC) database.
3
Scanning Electron Microscopy of Bristles
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Flies were anesthetized with CO2, decapitated, mounted and coated with gold. Scanning was performed on a Zeiss Gemini 450 SEM with electron high tension set to 5 kV. Signals were detected with detectors for secondary electrons (and backscattered electrons). For measuring the length of the bristles, only apparently intact bristles that were mounted relatively horizontally were considered. In all cases, only the length of the longer pSC bristles was recorded because these were apparently the ones that were mounted more horizontally and the measurements on the pictures could be expected to be more accurate.
4
Morphological Characterization of Ag NC GDEs
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The morphological characterization of the prepared Ag NC GDEs by SEM imaging experiments was performed before (for the as-prepared electrodes) and after electrochemical treatment. Analysis was conducted using a Zeiss Gemini 450 SEM equipped with an InLens secondary electron and a back-scattered electron detector. An accelerating voltage of 5 kV and a beam current of 200 pA were applied at a working distance of 4.5 mm. The AZtec 4.2 software (Oxford Instruments) was used to acquire EDX surface mappings of selected Ag NC GDEs. An acceleration voltage of 10 kV and a beam current of 1.2 nA were applied at a working distance of 8.5 mm.
5
Comprehensive Characterization of Catalytic Materials
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SEM images and EDX elemental mapping images were acquired using a ZEISS Gemini 450 SEM. TEM images were obtained using a JEM-2100F instrument. XRD measurements were carried out on a Rigaku D/MAX 2550 diffractometer with Cu Ka radiation (l = 1.5418 Å) at 35 kV and 25 mA in the 2 θ range from 5° to 70° with a scan rate of 0.02° per second. The compositions and valence of catalysts were determined by XPS Thermo ESCALAB 250Xi) with Mg Kα radiation source (hν = 1253.6 eV). All the peaks were calibrated with C 1s peak at 284.8 eV to determine the accurate binding energies (±0.1 eV). The deconvolution of the Al, Si, Ti, C, and O was performed through the software CasaXPS. UV-vis spectra were obtained on a UV-3600 Plus Shimadzu spectroscope, by using pure BaSO4 as a reference. The structure of the prepared materials was characterized by Raman spectroscopy on a Thermo Fisher Scientific Dxr2xi under a laser light at 532 nm, and FTIR spectra were recorded on a NEXUS670 infrared spectrophotometer. The textural properties of the samples were determined using N2 physisorption isotherms at 77 K on a Quantachrome Autosorb-3B analyzer.
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