The products of CO2 reacting with LiAlH4 and graphite samples were characterized by XRD (X’Pert PRO), Raman spectroscopy (Renishaw Invia plus), field emission scanning electron microscopy (FESEM, NOVA NANOSEM 450) with EDS (Oxford X-Max 80 SDD), high-resolution transmission electron microscopy (HRTEM, FEI Tecnai G2 F30), ICP-MS (PerkinElmer Elan DRC-e), and XPS (Kratos Axis Ultra DLD) with monochromatized Al Kα excitation source. The XRD data were collected on an X’Pert PRO diffractometer with Cu Kα radiation at 40 kV and 40 mA in the 2θ range of 10‒80°. Raman spectra were obtained at the excitation wavelength of 532 nm. Nitrogen adsorption and desorption measured on a Micromeritics ASAP 2020 were used to determine the specific surface area and pore size distribution of graphite submicroflakes. TG analysis (Q5000IR) was carried out from room temperature to 700 °C at a heating rate of 5 °C min–1 in air. Gas composition was determined by gas chromatography-mass spectrometry and FTIR spectra (Thermo Nicolet 6700).
X pert pro
Manufactured by Renishaw
The X'Pert PRO is a versatile X-ray diffraction (XRD) system designed for materials analysis. It provides high-resolution structural and compositional information about a wide range of materials, including metals, ceramics, polymers, and thin films. The system features advanced optics and detectors to deliver accurate and reliable data.
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2 protocols using x pert pro
1
Characterization of CO₂-LiAlH₄-Graphite Products
2
Multimodal Characterization of NTO Powders and Coatings
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Microstructural
and phase analyses of the NTO powders and the coatings were carried
out using X-ray diffraction (XRD: Panalytical X’Pert Pro) and
Raman spectroscopy (Renishaw inVia, using a 633 nm laser source).
The morphology and composition of the processed surfaces were characterized
using scanning electron microscopy (SEM, FEI NOVA 230) coupled with
an energy dispersive X-ray emission spectrometer (EDS, Thermo Scientific
UltraDry). Finally, both elemental compositions and valence states
were examined by X-ray photoelectron spectroscopy (XPS, Kratos Ultra
DLD) using monochromated Al Kα radiation (15 kV, 10 mA), with
a pass energy of 20 eV for high-resolution surveys. It should be noted
that, prior to the XPS analysis, the sample surfaces were cleaned
by Ar+ sputtering for 3 min to remove any surface impurities.
Following XPS analysis, quantitative analysis of the spectra was carried
out using the CasaXPS software.31
and phase analyses of the NTO powders and the coatings were carried
out using X-ray diffraction (XRD: Panalytical X’Pert Pro) and
Raman spectroscopy (Renishaw inVia, using a 633 nm laser source).
The morphology and composition of the processed surfaces were characterized
using scanning electron microscopy (SEM, FEI NOVA 230) coupled with
an energy dispersive X-ray emission spectrometer (EDS, Thermo Scientific
UltraDry). Finally, both elemental compositions and valence states
were examined by X-ray photoelectron spectroscopy (XPS, Kratos Ultra
DLD) using monochromated Al Kα radiation (15 kV, 10 mA), with
a pass energy of 20 eV for high-resolution surveys. It should be noted
that, prior to the XPS analysis, the sample surfaces were cleaned
by Ar+ sputtering for 3 min to remove any surface impurities.
Following XPS analysis, quantitative analysis of the spectra was carried
out using the CasaXPS software.31
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