Jsm 7610f microscope
The JSM-7610F is a field-emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of samples. The JSM-7610F utilizes a cold field-emission gun as the electron source, enabling it to achieve a high-resolution imaging capability with low accelerating voltages.
Lab products found in correlation
4 protocols using jsm 7610f microscope
Comprehensive Characterization of Nanoparticles
Characterization of Polymeric Gel Networks
FT-IR spectra of reaction solutions and gels were recorded on a Jasco FT/IR-410 (JASCO Corporation, Tokyo, Japan). The samples were put between KBr-Real Crystal IR-Card and Slip (International Crystal Laboratories, NJ, USA), and 30 scans were accumulated from 4000 to 500 cm−1.
The mechanical properties of the gels or porous polymers were investigated by the compression test using Tensilon RTE-1210 (ORIENTEC Co. LTD., Tokyo, Japan). The test samples, wet gels as prepared state or dried porous polymers, were cut to 0.7–1 cm cubes, and pressed at a rate of 0.5 mm/min at room temperature. Compression test of the gels was conducted at 24 h after the gel formation.
Scanning electron microscopy (SEM) images of the porous polymers were acquired by a JEOL (Tokyo, Japan) JSM-7610F microscope with a lower secondary electron image detector at an acceleration voltage of 3.0 kV.
The surface area of the porous polymers was measured by nitrogen sorption using an Autosorb 6AG (Quantachrome, FL, USA), and determined by the Brunauer–Emmett–Teller (BET) equation.
Surface Morphology Analysis of Bicomposite Films
Comprehensive Nanoparticle Characterization
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