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Xplora plus raman spectrometer

Manufactured by Horiba
Sourced in France

The XploRA PLUS Raman spectrometer is a versatile and high-performance instrument designed for Raman spectroscopy analysis. It provides accurate and reliable measurement of molecular and material properties through the detection and analysis of Raman scattering. The XploRA PLUS features advanced optics and a sensitive detector to ensure high-quality Raman spectra.

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11 protocols using xplora plus raman spectrometer

1

Raman Spectroscopy of Magnetic Grains

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Magnetically separated grains from LM sediment (section 2.2 above) were mounted in epoxy, and polished using a micro-diamond paste. Raman spectroscopy was conducted using a Horiba Ltd. XploRa Plus µ-Raman spectrometer. Analyses were done using a green laser (λ = 532 nm), which provided a power at the sample surface of 2.5 mW and were done using a 100×
objective focused down to a spot ~1 µm in diameter. Spectral slit width was set at 100 µm and the confocal hole was kept at 300 µm. Data were collected during three cycles of 30 s to optimize the full width at half-maximum of resolved Raman bands, while minimizing possible effects of heating or oxidation.
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2

Raman Spectroscopy of Magnetic Grains

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Magnetically separated grains from LM sediment (section 2.2 above) were mounted in epoxy, and polished using a micro-diamond paste. Raman spectroscopy was conducted using a Horiba Ltd. XploRa Plus µ-Raman spectrometer. Analyses were done using a green laser (λ = 532 nm), which provided a power at the sample surface of 2.5 mW and were done using a 100×
objective focused down to a spot ~1 µm in diameter. Spectral slit width was set at 100 µm and the confocal hole was kept at 300 µm. Data were collected during three cycles of 30 s to optimize the full width at half-maximum of resolved Raman bands, while minimizing possible effects of heating or oxidation.
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3

Comprehensive Material Characterization Protocol

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The transmittance spectra of studied materials were characterized using Fourier transform infrared (FTIR) spectroscopy on a Bruker Alpha FTIR with an attenuated total reflection (ATR) attachment in the 600–4000 cm−1 range. The absorption spectra of the samples were measured using a Jasco V-750 spectrometer in the 190–900 nm range. Raman spectroscopy was studied on a XploRA PLUS Raman spectrometer (Horiba, France) with a 50 × objective. X-ray diffraction (XRD) patterns were investigated using a Bruker D8 Advance Diffractometer with a CuKα radiation source (λ = 1.5418 Å). Morphological characterization was carried out using a Park XE-7 atomic force microscope (AFM) and a TESCAN MIRA3 field emission scanning electron microscope (SEM). AFM image analysis was carried out in XEI software (1.8.0 version) provided by PARK Systems, Korea. Elemental analysis was carried out by energy dispersive spectroscopy (EDS). Electrical characterizations (IV) and chemiresistive sensing experiments were measured with a Keithley 4200A semiconductor analyzer at room temperature (22 °C) in an indigenously designed and fabricated dynamic gas sensing system.
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4

Comprehensive Characterization of CSCs

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The elemental composition of the CSCs was analysed using a Perkin-Elmer PE-2400II CHN-analyser. The surface area and pore characteristics of the composites were determined via N2 adsorption–desorption isotherms study using Autosorb 1-C instrument (Quantachrome) at −196°C. All samples were degassed under vacuum at 300°C for 3 h prior to the measurements. The specific surface areas were calculated by the multipoint Brunauer–Emmett–Teller (BET) method and pore size distributions were determined using the Barrett–Joyner–Halenda (BJH) method. The morphological characteristics were revealed using a scanning electron microscope (LEO model 1450VP) with an accelerating voltage of 20 kV. Transmission electron microscopy (TEM) images were recorded using a TECNAI G2 (The Netherlands). ATR-FTIR spectra were recorded using a Bruker FTIR spectrometer (Tensor 27) with Opus 7.0 software measuring in the range of 4000–550 cm−1. The crystalline structure of the composite was studied by powder X-ray diffraction (XRD) using a Philips X-ray diffractometer (PW3040, The Netherlands) with CuKα radiation (λ = 0.15406 nm). XPS measurements were performed on a Kratos Axis Ultra DLD spectrometer (Manchester, UK). Raman test was carried out using a Horiba XploRA plus Raman spectrometer with a 532 nm laser excitation source.
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5

SERS Substrate Preparation with Methylene Blue

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Substrates for surface enhanced Raman scattering were prepared by drop-casting 50 μL of the dispersions onto glass slides held at 80°C on a hotplate. Once dried, 40 μL of methylene blue (10 μM) was added. A Horiba XploRa Plus Raman spectrometer was used for acquiring the spectra, using 2 accumulations for an acquisition time of 4 s at a laser power of 0.3 mW with a grating of 1200 grooves mm−1. The hole and slit width were maintained at 300 and 100 μm respectively.
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6

Raman Spectroscopy of Biological Samples

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Raman spectroscopy measurements were performed on a HORIBA XploRA PLUS Raman spectrometer. The laser wavelength was 532 nm with a power of 0.5 mW through a ×100 objective.
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7

In-Situ Raman Spectroelectrochemistry of Cu Electrodes

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Raman spectra were recorded with an XploRA PLUS Raman spectrometer (Horiba Jobin Yvon) equipped with a ×50 objective and a 638 nm He-Ne laser. The filter was set at 50%. The measurements were conducted using a custom-made three-electrode electrochemical cell with a quartz window, in which the as-prepared Cu electrode, Ag/AgCl (3.0 M KCl), and membrane-separated Pt wire were used as the working, reference, and counter electrodes. Before each test, the as-used electrolyte was pumped into the cell at a rate of 2 ml min−1. The equipped optical microscope was applied to acquire the real-time microscopic images of as-used Cu electrodes during the Raman tests.
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8

Comprehensive Materials Characterization

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X-ray powder diffraction (XRD) samples were recorded by a Phillips XPert diffractometer equipped with a two circle diffractometers and Cu tube. Transmission electron microscopy (TEM) micrographs were obtained on a 120 kV JEOL 1210 TEM, Transmission Electron Microscopy (HRTEM) micrographs obtained on a 200 kV JEOL 2011 TEM. Dynamic (SPECS GmbH, Berlin, Germany) in ultra-high vacuum conditions (base pressure 4 × 10−10 mbar) with a monochromatic aluminium Kα X-ray source (1486.74 eV). Light scattering (DLS) was done using a Zetasizer Nano. XPS measurements were performed with a Phoibos 150 analyser. Micro-Raman measurements were performed in backscattering geometry at room temperature using the 5145 Å line of argon-ion laser with a XploRA PLUS Raman spectrometer from Horiba, attached to an Olympus microscope and equipped with CCD detector. To perform microwave reaction, a microwave advanced flexible synthesis platform (flexiwave) from milestone was used.
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9

Raman Spectroscopic Analysis of Tea Powder

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The appropriate quantity of tea powder was meticulously placed in the center of a spotlessly clean slide, and compressed using a cover slip. Raman spectra were subsequently acquired using an Xplora PLUS Raman spectrometer equipped with a CCD detector (HORIBA, France), as illustrated in Fig. 1 (b). The spectrometer parameters were set as follows: the numerical aperture of the 50× objective was 0.55NA, the laser wavelength was 785 nm (10% laser power, 3.6 mW), the objective lens was 50 times, the grating was 1200 gr/nm, the wavelength range spanned 100-3700 cm−1, the spectral resolution was 1.3 cm−1, and each Raman spectrum was scanned for a duration of 8 s. The environmental conditions during the collection of spectra were maintained at 23 °C with a relative humidity of 45%. Each sample was tested four times, with the sampling locations for each test being randomly selected.

Materials and environmental instruments: (a) Comparison of Baimudan tea from different producing areas; (b) the Xplora PLUS Raman spectrometer used in the experiment.

Fig. 1
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10

Raman Spectroscopy of 3Cl1P in Cyclohexane

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The Raman measurements
for 3Cl1P and its 0.1 M solution in cyclohexane were performed using
a Horiba Xplora Plus Raman spectrometer with a laser operating at
780 nm (the power 30 mW). The Olympus MPlanN 10× objective was
chosen. Every spectrum was recorded with an acquisition time of 2
s and an accumulation of 60 scans.
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