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Geminisem 500

Manufactured by Hitachi

The GeminiSEM 500 is a scanning electron microscope (SEM) produced by Hitachi. It is designed for high-resolution imaging of a wide range of sample types. The GeminiSEM 500 utilizes a field emission electron source to achieve a high-brightness electron beam, enabling detailed analysis of materials at the nanoscale level.

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4 protocols using geminisem 500

1

Characterization of Perovskite Quantum Dot Films

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Contact angle measurement was carried out using SmartDrop software with a UNI-CAM (GITSOFTTECH) system. The surface tension was measured using KRÜSS BP100. The viscosity was measured using an Ubbelohde viscometer (Fungilab). We measured the thickness of the PQD films with the Dektak XT profiler. The AFM measurements were performed by Asylum Research MFP-3D-SA, operating under the tapping mode. The SEM images were collected in a GeminiSEM 500 with an accelerating voltage of 3 kV. Samples for transmission electron microscope (TEM) imaging were taken on a Hitachi HT7700 Exalens instrument with a 300 kV acceleration voltage. The PLQY of the PQD films was recorded using a Horiba Fluorolog-3 system with a Petite Integrating Sphere at an excitation wavelength of 405 nm. The TRPL was recorded using a Horiba time-correlated single-photon counting system at an excitation wavelength of 369 nm.
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2

Mechanical and Electrical Properties of MWCNT Electrode Films

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MWCNTs electrode films with different presence of gel electrolyte, including the ones with completely and incompletely infilled PVA/H3PO4 gel electrolyte, the one with mixed gel electrolyte of PVA/H3PO4 and the one with randomly stacked MWCNTs film without gel electrolyte, were cut into samples with the same size of 20 mm × 5 mm. The thicknesses of those films were the same as about 300 µm. Both ends of each sample were separately fixed to each chuck of a tensile test machine (TY8000, JiangSu TianYuan Co., Ltd). The data of tensile strain versus stress was recorded by a computer when the samples were stretched at a speed of 2 mm min−1. The conductivity of the samples was tested by four probe method. The electric resistance of the samples at different curvature was recorded by a source‐meter (Keysight B2900A), where the curvatures were operated by a linear motor.
All electrochemical tests, including CV, GCD, and EIS, were carried out in a two‐electrode system using an electrochemical working station (Versastat 3, Princeton Applied Research, USA) at room temperature. The SEM images and EDS data were obtained by GeminiSEM 500 and Hitachi SU8010.
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3

Characterization of LTGS Brick Properties

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Compressive strength tests were carried out according to the methodology described in the standard CNS 382.R2002. As defined in CNS 9212. B7197, the constant loading rate was set as 1 mm/min.
The water absorption and bulk specific density tests, based on Archimedes’ principle, were conducted according to CNS 619.R3013.
The water absorption ( AW ) was calculated as follows: AW(%)=W3W1W3W2×100
The bulk specific density ( Db ) was calculated as follows: AW(%)=W3W1W3W2×100
where W1 denotes the weight of the specimen after complete drying at 105–120 °C, W2 represents the weight of the specimen after 24 h of soaking, and W3 indicates the saturation weight of the specimen.
The test results of compressive strength, flexural strength, and physical properties were all obtained after averaging the test data of five specimens.
To investigate the LTGS bricks’ microstructure, crystal phase, and chemical properties, scanning electron microscopy (SEM/EDS) analysis, X-ray diffraction (XRD) analysis, and X-ray fluorescence (XRF) were performed. We performed SEM (ZEISS Gemini SEM500) at 0.02–30 kV; XRD (Hitachi U-3310) analysis was conducted with Cu Ka, λ = 1.54060 × 10−10 m radiation, at 30 kV, 10 mA, and 11.4°/min; and the XRF (Hitachi X-MET8000) by Pd target to identify the LTGS bricks.
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4

Multimodal Characterization of PRGO/Au Microrod

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Scanning electron microscopy (SEM) was carried out using a GeminiSEM 500 at an acceleration voltage of 5 kV. Transmission electron microscopy (TEM) images were obtained with Hitachi H‐7650 at an acceleration voltage of 120 kV. X‐ray power diffraction (XRD) patterns were recorded on a Philips X'Pert X‐ray diffractometer with Cu Kα radiation. X‐ray photoelectron spectra (XPS) for PRGO/Au MRs were determined by an X‐ray photoelectron spectrometer (ESCA Lab MKII) with Mg Kα radiation. TEM images and EDS maps were obtained with JEOL‐2100F microscope at an acceleration voltage of 200 kV after slicing a PRGO/Au microrod in 200 nm slices, which are prepared in Core Facility center for Life Sciences. Soft X‐ray tomography were performed with the soft X‐ray microscopy at BL07W beamline in the National Synchrotron Radiation Laboratory (NSRL). X‐ray CT was tested with Xradia 520 versa in USTC Center for Micro‐ and Nanoscale Research and Fabrication.
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