Dxr raman microscope spectrometer

The as-synthesized S,N-CQDs and AgNPs@S,N-CQDs were characterized using UV-Visible absorption spectroscopy (Shimadzu, Japan) and fluorescence spectroscopy (Thermo Fisher Scientific, China). The Fourier transform infrared (FTIR) spectra were determined on an IRAffinity-1 spectrophotometer (Shimadzu, Japan). X-ray diffraction (XRD) patterns were measured using a D/max/-2200/PC (Rigaku Corporation, Japan). High-resolution transmission electron microscopy (HRTEM) of AgNPs@S,N-CQDs was performed using a H-7650 (Hitachi, Japan). In addition, X-ray photoelectron spectroscopy (XPS) was performed on an ESCALAB 250 XI (Thermo Fisher Scientific, China). Scanning electronic microscopy (SEM) images and energy-dispersive spectroscopy (EDS) data of AgNPs@S,N-CQDs were obtained using a JSM-7610F PLUS electron microscope (JAPAN). Zeta potential was examined using a Zetasizer Nano ZS90 (Malvern, UK). Raman spectra were recorded using a DXR Raman microscope spectrometer (Thermo Scientific, China).^{18 (link)}

Electrochemical studies were performed in 1 M H₂SO₄ solution on Advanced Electrochemical System Parstat 2273. Glassy carbon electrodes with CNW films were used as working electrodes in an asymmetric scheme with a large-area Au counter electrode and a standard hydrogen reference electrode. Structural analysis was performed with a use of Scanning Electron Microscope (SEM) Carl Zeiss Supra 40, Thermo Scientific DXR Raman Microscope spectrometer. X-ray photoelectron spectra (XPS) were recorded on an Axis Ultra DLD spectrometer (Kratos) using monochromatic Al Kα radiation.