D max iiia powder x ray diffractometer

The surface morphology and structure of the adsorbents were observed with SEM (JEOL 6500F, Japan). A surface area and pore size analyzer (Quantachrome, FL, USA) was used to determine the surface area and pore size of the adsorbents at a relative pressure of 0.95 following the multipoint N₂-BET adsorption method. The crystalline structures of the adsorbents were studied using a D/Max-IIIA Powder X-ray Diffractometer (Rigaku Corp., Japan). The surface functional groups of the adsorbents were investigated by using a Nexus 670 FTIR spectrometer (Thermo Nicolet, Madison) in the wave number range of 500–4000 cm⁻¹. An XPS (X-ray photoelectron spectrometer, Krato AXIS Ultra DLD, Japan) and the model Axis-HS (Kratos Analytical) were used to determine the surface composition.

SEM (SIGMA, Germany) was used for observing the surface morphology and structure of the adsorbents. An FT-IR spectrometer (Nexus 670, Madison) in the wave number range of 400–4000 cm⁻¹ was used for testing the surface functional groups of the adsorbents. A D/Max-IIIA powder X-ray diffractometer (Rigaku Corp., Japan) was used to analyze the XRD of the adsorbents. A surface area and pore size analyzer (BELSORP-max, Japan) was used to analyze the surface area and pore size of the adsorbents at a relative pressure of 0.95 following the multipoint N₂-BET adsorption method.