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Smartlab x ray diffractometer

Manufactured by Anton Paar
Sourced in Japan

The SmartLab X-ray diffractometer is an analytical instrument designed for the structural analysis of materials. It uses X-ray diffraction technology to provide detailed information about the atomic and molecular structure of solid samples.

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2 protocols using smartlab x ray diffractometer

1

Spectroscopic Characterization of Europium Complexes

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1H NMR (400 MHz) spectra were recorded on a JEOL
ECS400. Chemical shifts were reported in δ ppm, referenced to an
internal tetramethylsilane standard for 1H NMR spectroscopy.
Infrared spectra were measured using a Thermo Nicolet AVATAR 320 FT-IR
spectrometer. FAB-MS spectra were recorded on a JEOL JMS-700TZ. Elemental
analyses were performed on a J-Science Lab Micro Corder JM 10 and an Exeter
Analytical CE440. In addition, the ratio of F to Eu was measured using Energy
Dispersive X-ray Fluorescence Spectrometer EDX-8000 with (reference material:
Eu(hfa)3(TPPO)2). XRD patterns were characterized by a
RIGAKU SmartLab X-ray diffractometer with Cu Kα radiation, a D/teX
Ultra detector, and a temperature control unit (Anton Paar, TCU-110).
Thermogravimetric Analysis was performed on a Seiko Instruments Inc. EXSTAR 6000
(TG-DTA 6300) at first heating rate of 10 °C
min−1 up to 100 °C,
cooling rate of 10 °C min−1up to 40 °C, and second heating rate of
1 °C min−1 up to
500 °C.
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2

Powder XRD Measurements of n-C15F32

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Powder XRD measurements were performed on a Rigaku (Tokyo, Japan) SmartLab X-ray diffractometer equipped with an Anton Paar (Graz, Austria) DCS 500 domed sample stage and a CCU 100 temperature controller. The temperature was increased and decreased at the rate of < 20 °C min -1 . Cu Kα radiation (λ = 0.15418 nm) was generated from a sealed-tube X-ray source operated at 50 kV and 40 mA. The parallel X-ray beam was used to ensure that the effects of uneven surfaces would be negligible. The beam was irradiated onto the surface of well-ground n-C 15 F 32 , and the scattered rays were detected by a Rigaku HyPix-3000 hybrid pixel counting detector at scattering angles, 2θ, ranging from 2° to 25°. The scanning speed was set to 2° min -1 with steps of 0.02°.
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