Melting points were determined using Yanaco melting point device and were uncorrected. Infrared (IR) spectra were recorded by Jasco FT/IR-6600 spectrophotometer as KBr disks and were expressed in wavenumber (cm−1). NMR spectra were measured using Bruker Advance III HD at 400 MHz for 1H NMR, 100 MHz for 13C NMR and 376 MHz for 19F NMR in deuterated CDCl3, DMSO-d6 or MeOH-d4 using tetramethyl silane (TMS) as an internal standard. Coupling constant values (J) were determined in Hertz (Hz) and chemical shifts (δ) were expressed in ppm. High resolution mass spectra (HRMS) were measured with Thermo Fisher Scientific LTQ Orbitrap XL spectrophotometer using electrospray ionization (ESI) and were expressed as [M+H]+ or [M+Na]+ at Natural Science Research and Development Center, Hiroshima University, Japan. The reaction mixtures were monitored by thin layer chromatography (TLC) using Merck silica gel 60F254 aluminum sheets. Column chromatography was conducted using silica gel 60 N, 63–210 μm that was purchased from Kanto Chemical Co. Inc. Unless otherwise mentioned, all solvents and chemical reagents were commercially available and were used without further purification.
Ft ir 6600 spectrophotometer
Manufactured by Jasco
Sourced in Germany
The FT/IR-6600 spectrophotometer is a laboratory instrument designed for Fourier-transform infrared (FT/IR) spectroscopy. It is used to analyze the molecular composition of various materials by detecting their infrared absorption spectrum.
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2 protocols using ft ir 6600 spectrophotometer
1
Synthesis and Characterization of Organic Compounds
2
Synthesis and Characterization of Silver Nanowires
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A Perimax peristaltic pump from Spetec and a Sorvall ST 8 Centrifuge (Thermo Scientific, Walthman, MA, USA) were used for the synthesis of the AgNWs. Films were prepared using a Spincoater 1H-D7 device (Mikasa, Tokyo, Japan). UV–Vis characterization of AgNWs dispersions was performed using a UV-2600 device (Shimadzu., Duisburg, Germany) Fourier Transform Infrared (FTIR) spectra of films deposited on ZnS substrate were obtained using an FTIR 6600 spectrophotometer (Jasco, Pfungstadt, Germany) from 700 to 4000 cm−1, at a resolution of 4 cm−1 and 1000 scans.
X-ray diffraction (DRX) was performed using a Bruker Discover D8 (Bruker, Ettlingen, Germany) with a wavelength of 1.5418 Å. Transmission electron microscopy (TEM) images were obtained with a JEM 1011HR microscope (Jeol, Freising, Germany). Atomic force microscopy (AFM) images were recorded in films deposited on ITO at room temperature in a Cypher ES Environmental AFM device (Oxford Instruments, Asylum research, Wiesbaden, Germany) operated in tapping mode with blueDrive photothermal excitation technology. The tip used was an AC160TSA-R3 (Oxford Instruments, Asylum research, Wiesbaden, Germany). Electrochemical measurements were carried out using a PGSTAT128 potentiostat/galvanostat (AutolabMetrohm, Utrecht, The Netherlands).
X-ray diffraction (DRX) was performed using a Bruker Discover D8 (Bruker, Ettlingen, Germany) with a wavelength of 1.5418 Å. Transmission electron microscopy (TEM) images were obtained with a JEM 1011HR microscope (Jeol, Freising, Germany). Atomic force microscopy (AFM) images were recorded in films deposited on ITO at room temperature in a Cypher ES Environmental AFM device (Oxford Instruments, Asylum research, Wiesbaden, Germany) operated in tapping mode with blueDrive photothermal excitation technology. The tip used was an AC160TSA-R3 (Oxford Instruments, Asylum research, Wiesbaden, Germany). Electrochemical measurements were carried out using a PGSTAT128 potentiostat/galvanostat (AutolabMetrohm, Utrecht, The Netherlands).
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